{"id":"https://openalex.org/A5111539954","orcid":null,"observed_orcids":[],"display_name":"Koji Shinohara","raw_author_names":["K. Shinohara","Koji SHINOHARA","Koji Shinohara","Shinohara, K."],"full_name":"Shinohara, Koji","works_count":34,"cited_by_count":231,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":8,"i10_index":8},"ids":{"openalex":"https://openalex.org/A5111539954","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1298590031","ror":"https://ror.org/01w6wtk13","display_name":"Shizuoka University","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]},"years":[1989,1986]},{"institution":{"id":"https://openalex.org/I2252096349","ror":"https://ror.org/038e2g226","display_name":"Fujitsu (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},"years":[1993,1992,1989,1988,1987,1986,1985,1983,1982,1981,1980,1979,1971]}],"last_known_institutions":[{"id":"https://openalex.org/I2252096349","ror":"https://ror.org/038e2g226","display_name":"Fujitsu (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":26,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","count":19,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","count":11,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":9,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","count":7,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":0.0001161,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","value":4.81e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","value":4.77e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12760","display_name":"Laser Design and Applications","value":4.47e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","value":4.26e-05,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","score":0.8686960935592651},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.838615894317627},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7860000133514404},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.6130958199501038},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3590281009674072}],"counts_by_year":[{"year":1971,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1979,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1980,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":1981,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1982,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1983,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1985,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1986,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1987,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1988,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["K. Shinohara","Koji SHINOHARA","Koji Shinohara","Shinohara, K."],"block_key":"k shinohara","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111539954","awards_count":0,"updated_date":"2026-11-01T11:00:13","created_date":"2016-06-24T00:00:00"}