{"id":"https://openalex.org/A5111503154","orcid":null,"observed_orcids":[],"display_name":"Toshihisa Watabe","raw_author_names":["T. Watabe","Toshihisa Watabe"],"full_name":"Toshihisa Watabe","works_count":76,"cited_by_count":627,"summary_stats":{"2yr_mean_citedness":0.16666666666666666,"h_index":13,"i10_index":13},"ids":{"openalex":"https://openalex.org/A5111503154","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1298590031","ror":"https://ror.org/01w6wtk13","display_name":"Shizuoka University","country_code":"JP","type":"education","lineage":["https://openalex.org/I1298590031"]},"years":[2015,2014,2013,2012]},{"institution":{"id":"https://openalex.org/I203951103","ror":"https://ror.org/02kn6nx58","display_name":"Keio University","country_code":"JP","type":"education","lineage":["https://openalex.org/I203951103"]},"years":[1991]},{"institution":{"id":"https://openalex.org/I4210107548","ror":"https://ror.org/01s8tz949","display_name":"Japan Broadcasting Corporation (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]},"years":[2024,2022,2021,2020,2019,2018,2017,2016,2013,2012,2011,2010,2009,2007,2005,2004,1999]},{"institution":{"id":"https://openalex.org/I4405256961","ror":"https://ror.org/04qgk0f68","display_name":"NHK Engineering System, Inc.","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4405256961"]},"years":[2024,2015,2014,2013]},{"institution":{"id":"https://openalex.org/I4405287265","ror":"https://ror.org/04mdx9d04","display_name":"Research Institute of Electronics, Shizuoka University","country_code":"JP","type":"facility","lineage":["https://openalex.org/I1298590031","https://openalex.org/I4405287265"]},"years":[2015,2014,2013,2012]}],"last_known_institutions":[{"id":"https://openalex.org/I4210107548","ror":"https://ror.org/01s8tz949","display_name":"Japan Broadcasting Corporation (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210107548"]},{"id":"https://openalex.org/I4405256961","ror":"https://ror.org/04qgk0f68","display_name":"NHK Engineering System, Inc.","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4405256961"]}],"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","count":66,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","count":28,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","count":22,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":17,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","count":15,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","value":0.0007615,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":0.0002601,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","value":0.0001286,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":7.58e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","value":6.77e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8852872252464294},{"id":"76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","score":0.8754000067710876},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7298034429550171},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6645687818527222},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.36757704615592957}],"counts_by_year":[{"year":1988,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":4,"oa_works_count":2,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":3,"oa_works_count":0,"cited_by_count":25},{"year":2013,"works_count":3,"oa_works_count":1,"cited_by_count":34},{"year":2014,"works_count":3,"oa_works_count":1,"cited_by_count":54},{"year":2015,"works_count":2,"oa_works_count":1,"cited_by_count":40},{"year":2016,"works_count":7,"oa_works_count":1,"cited_by_count":45},{"year":2017,"works_count":7,"oa_works_count":1,"cited_by_count":38},{"year":2018,"works_count":6,"oa_works_count":1,"cited_by_count":49},{"year":2019,"works_count":6,"oa_works_count":1,"cited_by_count":36},{"year":2020,"works_count":6,"oa_works_count":4,"cited_by_count":39},{"year":2021,"works_count":3,"oa_works_count":0,"cited_by_count":48},{"year":2022,"works_count":2,"oa_works_count":2,"cited_by_count":44},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2024,"works_count":6,"oa_works_count":6,"cited_by_count":34},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":7}],"display_name_alternatives":["T. Watabe","Toshihisa Watabe"],"block_key":"t watabe","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111503154","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}