{"id":"https://openalex.org/A5111379136","orcid":null,"observed_orcids":[],"display_name":"A. K. Bandyopadhyay","raw_author_names":["A K Bandyopadhyay","A. K. Bandyopadhyay","A.K Bandyopadhyay","A.K. Bandyopadhyay","Bandyopadhyay, A. K.","Bandyopadhyay, A.K:","Dr. A. K. Bandyopadhyay"],"full_name":"A. K. Bandyopadhyay","works_count":26,"cited_by_count":190,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":8,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5111379136","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I134421475","ror":"https://ror.org/015w2mp89","display_name":"National Physical Laboratory","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]},"years":[1988]},{"institution":{"id":"https://openalex.org/I66760702","ror":"https://ror.org/021wm7p51","display_name":"Council of Scientific and Industrial Research","country_code":"IN","type":"government","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210134808","https://openalex.org/I66760702"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I88910343","ror":"https://ror.org/0307k1x46","display_name":"CSIR National Physical Laboratory of India","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210134808","https://openalex.org/I66760702","https://openalex.org/I88910343"]},"years":[2013,2010,2005,2003,1990,1988]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":15,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":11,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11878","display_name":"Solid-state spectroscopy and crystallography","count":10,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10413","display_name":"High-pressure geophysics and materials","count":7,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":6.52e-05,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":5.84e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","value":4.61e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11878","display_name":"Solid-state spectroscopy and crystallography","value":3.28e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":3.28e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","score":0.8269132375717163},{"id":"165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","score":0.7652999758720398},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.734499990940094},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.46149998903274536},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.35678035020828247}],"counts_by_year":[{"year":1988,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1990,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2013,"works_count":2,"oa_works_count":1,"cited_by_count":6},{"year":2014,"works_count":3,"oa_works_count":0,"cited_by_count":7},{"year":2015,"works_count":2,"oa_works_count":0,"cited_by_count":5},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":6}],"display_name_alternatives":["A K Bandyopadhyay","A. K. Bandyopadhyay","A.K Bandyopadhyay","A.K. Bandyopadhyay","Bandyopadhyay, A. K.","Bandyopadhyay, A.K:","Dr. A. K. Bandyopadhyay"],"block_key":"a bandyopadhyay","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111379136","updated_date":"2026-10-28T12:34:19","created_date":"2016-06-24T00:00:00"}