{"id":"https://openalex.org/A5111344180","orcid":"https://orcid.org/0000-0001-5305-7586","observed_orcids":["https://orcid.org/0000-0001-5305-7586"],"display_name":"Xuemin Sheng","raw_author_names":["Xue-Min Sheng","Xuemin Sheng","xuemin Sheng"],"full_name":"Xuemin Sheng","works_count":4,"cited_by_count":2,"summary_stats":{"2yr_mean_citedness":0.5,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5111344180","orcid":"https://orcid.org/0000-0001-5305-7586","observed_orcids":["https://orcid.org/0000-0001-5305-7586"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4401041622","ror":"https://ror.org/04713ex73","display_name":"Chengdu Technological University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4401041622"]},"years":[2025,2024]}],"last_known_institutions":[{"id":"https://openalex.org/I4401041622","ror":"https://ror.org/04713ex73","display_name":"Chengdu Technological University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4401041622"]}],"topics":[{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","count":4,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10245","display_name":"Metamaterials and Metasurfaces Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","count":1,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","value":2.67e-05,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","value":1.18e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","value":1.12e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":1e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10245","display_name":"Metamaterials and Metasurfaces Applications","value":3.6e-06,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7534297704696655},{"id":"121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","score":0.5315508842468262},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.42824554443359375},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.4097493588924408},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.29149624705314636}],"counts_by_year":[{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2025,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Xue-Min Sheng","Xuemin Sheng","xuemin Sheng"],"block_key":"x sheng","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111344180","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5111344180","updated_date":"2026-11-13T15:08:24","created_date":"2024-05-16T00:00:00"}