{"id":"https://openalex.org/A5111342387","orcid":null,"observed_orcids":[],"display_name":"M. Denais","raw_author_names":["DENAIS, Micka\u00ebl","M Denais","M. Denais"],"full_name":"Denais, Martin","works_count":46,"cited_by_count":2239,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":18,"i10_index":28},"ids":{"openalex":"https://openalex.org/A5111342387","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2006,2005,2004]},{"institution":{"id":"https://openalex.org/I4210104693","ror":"https://ror.org/01c74sd89","display_name":"STMicroelectronics (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},"years":[2007,2006,2005,2004]},{"institution":{"id":"https://openalex.org/I4210105943","ror":"https://ror.org/01cah1n37","display_name":"Institut des Sciences de l'Evolution de Montpellier","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I131077856","https://openalex.org/I159885104","https://openalex.org/I19894307","https://openalex.org/I2746051580","https://openalex.org/I2802818602","https://openalex.org/I4210090127","https://openalex.org/I4210105943","https://openalex.org/I4210107625","https://openalex.org/I4210131494","https://openalex.org/I4210166444"]},"years":[2005]},{"institution":{"id":"https://openalex.org/I4210112016","ror":"https://ror.org/0238zyh04","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I4210098836","https://openalex.org/I4210112016","https://openalex.org/I4387153205"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I4210165709","ror":"https://ror.org/05jz46060","display_name":"Philips (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210165709"]},"years":[2006,2005]}],"last_known_institutions":[{"id":"https://openalex.org/I4210104693","ror":"https://ror.org/01c74sd89","display_name":"STMicroelectronics (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":43,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","count":22,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":20,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":12,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":0.0002397,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":0.0001975,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0001133,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":8.91e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":6.06e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","score":0.7961374521255493},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7375070452690125},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.6063516139984131},{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.5182454586029053},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3811284601688385}],"counts_by_year":[{"year":2004,"works_count":11,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":17,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":13,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":104},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":152},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":146},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":97},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":75},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":90},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":87},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":62},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":66},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":64},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":53},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":53},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":41},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":58},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":31}],"display_name_alternatives":["DENAIS, Micka\u00ebl","M Denais","M. Denais"],"block_key":"m denais","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111342387","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}