{"id":"https://openalex.org/A5111172722","orcid":"https://orcid.org/0009-0008-1028-498X","observed_orcids":["https://orcid.org/0009-0008-1028-498X"],"display_name":"Ruoyan Tian","raw_author_names":["Ruoyan Tian"],"full_name":"Ruoyan Tian","works_count":7,"cited_by_count":13,"summary_stats":{"2yr_mean_citedness":1.8571428571428572,"h_index":2,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5111172722","orcid":"https://orcid.org/0009-0008-1028-498X","observed_orcids":["https://orcid.org/0009-0008-1028-498X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4391767976","ror":"https://ror.org/01mr5b726","display_name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391767976","https://openalex.org/I47720641"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I47720641","ror":"https://ror.org/00p991c53","display_name":"Huazhong University of Science and Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]},"years":[2026,2024]}],"last_known_institutions":[{"id":"https://openalex.org/I47720641","ror":"https://ror.org/00p991c53","display_name":"Huazhong University of Science and Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","count":5,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10572","display_name":"Geophysical and Geoelectrical Methods","count":1,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":6.03e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","value":3.64e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","value":1.56e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13615","display_name":"Transportation Systems and Safety","value":1.29e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","value":9.3e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","score":0.6321415901184082},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5863999724388123},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.4582909345626831},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.34769999980926514},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.32089999318122864}],"counts_by_year":[{"year":2024,"works_count":4,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2026,"works_count":3,"oa_works_count":1,"cited_by_count":4}],"display_name_alternatives":["Ruoyan Tian"],"block_key":"r tian","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111172722","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5111172722","updated_date":"2026-11-08T12:57:04","created_date":"2024-04-13T00:00:00"}