{"id":"https://openalex.org/A5111099746","orcid":null,"observed_orcids":[],"display_name":"Sinta Watanabe","raw_author_names":["S. WATANABE","S. Watanabe","Sinta Watanabe"],"full_name":"Sinta Watanabe","works_count":28,"cited_by_count":460,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":9,"i10_index":9},"ids":{"openalex":"https://openalex.org/A5111099746","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I114531698","ror":"https://ror.org/0112mx960","display_name":"Tokyo Institute of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698","https://openalex.org/I4400009020"]},"years":[2023,2022,2008,2004,1992]},{"institution":{"id":"https://openalex.org/I180203408","ror":"https://ror.org/03zyp6p76","display_name":"Yokohama National University","country_code":"JP","type":"education","lineage":["https://openalex.org/I180203408"]},"years":[1990]},{"institution":{"id":"https://openalex.org/I201537933","ror":"https://ror.org/01dq60k83","display_name":"Tohoku University","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},"years":[2008,2005]},{"institution":{"id":"https://openalex.org/I2252096349","ror":"https://ror.org/038e2g226","display_name":"Fujitsu (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},"years":[2003]},{"institution":{"id":"https://openalex.org/I4210106587","ror":"https://ror.org/01bvqg661","display_name":"Nikon (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210106587"]},"years":[2002,2001,2000,1999]},{"institution":{"id":"https://openalex.org/I4210110652","ror":"https://ror.org/01sjwvz98","display_name":"RIKEN","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210110652"]},"years":[1999]},{"institution":{"id":"https://openalex.org/I4387152242","ror":"https://ror.org/04664mr26","display_name":"Institute for Materials Research, Tohoku University","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4387152242"]},"years":[2005]},{"institution":{"id":"https://openalex.org/I4405264885","ror":"https://ror.org/03917y941","display_name":"Okaya Electric Industries Co., Ltd. (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405264885"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I60134161","ror":"https://ror.org/04chrp450","display_name":"Nagoya University","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]},"years":[1994,1993]},{"institution":{"id":"https://openalex.org/I85922643","ror":"https://ror.org/00ys1hz88","display_name":"Nagaoka University of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I85922643"]},"years":[2003]}],"last_known_institutions":[{"id":"https://openalex.org/I114531698","ror":"https://ror.org/0112mx960","display_name":"Tokyo Institute of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698","https://openalex.org/I4400009020"]}],"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","count":11,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","count":5,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11442","display_name":"Titanium Alloys Microstructure and Properties","count":3,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","count":3,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","value":6.66e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","value":6.64e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","value":6.63e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","value":3.61e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12506","display_name":"Nuclear materials and radiation effects","value":2.14e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9217566251754761},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.8711569309234619},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5965701937675476},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.4266068637371063},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.38504040241241455}],"counts_by_year":[{"year":1990,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1994,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":26},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":32},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":30},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":21},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2022,"works_count":2,"oa_works_count":2,"cited_by_count":16},{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":13},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":6}],"display_name_alternatives":["S. WATANABE","S. Watanabe","Sinta Watanabe"],"block_key":"s watanabe","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111099746","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}