{"id":"https://openalex.org/A5111024792","orcid":"https://orcid.org/0009-0000-2706-2111","observed_orcids":["https://orcid.org/0009-0000-2706-2111"],"display_name":"Marvin Lotz","raw_author_names":["M Lotz","Marvin Lotz"],"full_name":"Marvin Lotz","works_count":3,"cited_by_count":2,"summary_stats":{"2yr_mean_citedness":0.5,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5111024792","orcid":"https://orcid.org/0009-0000-2706-2111","observed_orcids":["https://orcid.org/0009-0000-2706-2111"]},"affiliations":[{"institution":{"id":"https://openalex.org/I153267046","ror":"https://ror.org/04zrf7b53","display_name":"University of Kaiserslautern","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046","https://openalex.org/I4387152675"]},"years":[2025,2023]},{"institution":{"id":"https://openalex.org/I4387152675","ror":"https://ror.org/01qrts582","display_name":"Rheinland-Pf\u00e4lzische Technische Universit\u00e4t Kaiserslautern-Landau","country_code":"DE","type":"education","lineage":["https://openalex.org/I4387152675"]},"years":[2025,2023]}],"last_known_institutions":[{"id":"https://openalex.org/I153267046","ror":"https://ror.org/04zrf7b53","display_name":"University of Kaiserslautern","country_code":"DE","type":"education","lineage":["https://openalex.org/I153267046","https://openalex.org/I4387152675"]},{"id":"https://openalex.org/I4387152675","ror":"https://ror.org/01qrts582","display_name":"Rheinland-Pf\u00e4lzische Technische Universit\u00e4t Kaiserslautern-Landau","country_code":"DE","type":"education","lineage":["https://openalex.org/I4387152675"]}],"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":2,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10313","display_name":"Surface Modification and Superhydrophobicity","count":1,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","value":2.95e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":1.77e-05,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12814","display_name":"Gaussian Processes and Bayesian Inference","value":1.63e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10313","display_name":"Surface Modification and Superhydrophobicity","value":7.6e-06,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":6.9e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5650013089179993},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.49645835161209106},{"id":"105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","score":0.3525269031524658},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3459551930427551},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.2843785881996155}],"counts_by_year":[{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":2,"oa_works_count":1,"cited_by_count":1}],"display_name_alternatives":["M Lotz","Marvin Lotz"],"block_key":"m lotz","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111024792","updated_date":"2026-10-10T12:59:14","created_date":"2025-10-10T00:00:00"}