{"id":"https://openalex.org/A5110467908","orcid":"https://orcid.org/0009-0009-4757-892X","observed_orcids":["https://orcid.org/0009-0009-4757-892X"],"display_name":"Paula Peres","raw_author_names":["P Peres","P. Peres","Paula Peres"],"full_name":"Paula Peres","works_count":32,"cited_by_count":369,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":11,"i10_index":11},"ids":{"openalex":"https://openalex.org/A5110467908","orcid":"https://orcid.org/0009-0009-4757-892X","observed_orcids":["https://orcid.org/0009-0009-4757-892X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210100195","ror":"https://ror.org/01at47r33","display_name":"Cameca (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210100195"]},"years":[2026,2024,2023,2021,2020,2019,2018,2017,2016,2015,2012,2010,2009,2008,2007,2006,2004]},{"institution":{"id":"https://openalex.org/I4210152314","ror":"https://ror.org/056gaxr94","display_name":"Cameca (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210100195","https://openalex.org/I4210152314"]},"years":[2020,2015]}],"last_known_institutions":[{"id":"https://openalex.org/I4210100195","ror":"https://ror.org/01at47r33","display_name":"Cameca (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210100195"]}],"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":30,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":15,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","count":10,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10001","display_name":"Geological and Geochemical Analysis","count":6,"subfield":{"id":"https://openalex.org/subfields/1906","display_name":"Geochemistry and Petrology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":0.000104,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":4.46e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","value":3.55e-05,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","value":3.29e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","value":1.91e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.898391842842102},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.6673339605331421},{"id":"113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","score":0.6582746505737305},{"id":"43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","score":0.1252213418483734},{"id":"178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","score":0.0}],"counts_by_year":[{"year":2004,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":3,"oa_works_count":0,"cited_by_count":16},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2015,"works_count":1,"oa_works_count":1,"cited_by_count":15},{"year":2016,"works_count":1,"oa_works_count":1,"cited_by_count":20},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":15},{"year":2018,"works_count":3,"oa_works_count":2,"cited_by_count":24},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":22},{"year":2020,"works_count":3,"oa_works_count":2,"cited_by_count":30},{"year":2021,"works_count":2,"oa_works_count":2,"cited_by_count":30},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":43},{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":30},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":27},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":37},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":21}],"display_name_alternatives":["P Peres","P. Peres","Paula Peres"],"block_key":"p peres","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110467908","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5110467908","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}