{"id":"https://openalex.org/A5110320744","orcid":null,"observed_orcids":[],"display_name":"Jurgen M. Wolf","raw_author_names":["Jurgen M. Wolf","Jurgen Wolf","J\u00fcrgen M. Wolf","J\u00fcrgen Wolf","Wolf, J\u00fcrgen","Wolf, J\u00fcrgen M."],"full_name":"Jurgen M. Wolf","works_count":28,"cited_by_count":168,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":7,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5110320744","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210131389","ror":"https://ror.org/03cvz4414","display_name":"W\u00fcrth Elektronik (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210131389"]},"years":[2022,2021,2015]},{"institution":{"id":"https://openalex.org/I4210134425","ror":"https://ror.org/031aqk326","display_name":"Fraunhofer Institute for Reliability and Microintegration","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210134425","https://openalex.org/I4923324"]},"years":[2024,2017,2015,2012,2010,2009,2008,2007,2005,2000]},{"institution":{"id":"https://openalex.org/I4405268488","ror":"https://ror.org/014zt3e74","display_name":"All Silicon System Integration Dresden","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210134425","https://openalex.org/I4405268488","https://openalex.org/I4923324"]},"years":[2022,2017,2011]},{"institution":{"id":"https://openalex.org/I4577782","ror":"https://ror.org/03v4gjf40","display_name":"Technische Universit\u00e4t Berlin","country_code":"DE","type":"education","lineage":["https://openalex.org/I4577782"]},"years":[2012,2003,1992]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","count":19,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","count":15,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":4,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","count":3,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":3,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":0.0002181,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","value":8.21e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":3.8e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":2.99e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":2.75e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8940754532814026},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.589900016784668},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5636648535728455},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.45394399762153625},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.38140609860420227}],"counts_by_year":[{"year":1992,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":13},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2015,"works_count":4,"oa_works_count":0,"cited_by_count":5},{"year":2016,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2017,"works_count":3,"oa_works_count":0,"cited_by_count":3},{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":8},{"year":2022,"works_count":2,"oa_works_count":0,"cited_by_count":7},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":11},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Jurgen M. Wolf","Jurgen Wolf","J\u00fcrgen M. Wolf","J\u00fcrgen Wolf","Wolf, J\u00fcrgen","Wolf, J\u00fcrgen M."],"block_key":"j wolf","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110320744","updated_date":"2026-11-03T12:34:24","created_date":"2016-06-24T00:00:00"}