{"id":"https://openalex.org/A5110186838","orcid":null,"observed_orcids":[],"display_name":"Kouichi Ono Kouichi Ono","raw_author_names":["Kouichi ONO","Kouichi Ono Kouichi Ono"],"full_name":"Kouichi Ono Kouichi Ono","works_count":17,"cited_by_count":506,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":11,"i10_index":12},"ids":{"openalex":"https://openalex.org/A5110186838","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I22299242","ror":"https://ror.org/02kpeqv85","display_name":"Kyoto University","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]},"years":[1999]},{"institution":{"id":"https://openalex.org/I4210133125","ror":"https://ror.org/033y26782","display_name":"Mitsubishi Electric (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]},"years":[1997,1996,1995,1994]}],"last_known_institutions":[{"id":"https://openalex.org/I22299242","ror":"https://ror.org/02kpeqv85","display_name":"Kyoto University","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":12,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Low-Pressure Plasma Processing and Diagnostics","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","count":8,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10642","display_name":"Atmospheric-Pressure Plasma Applications","count":6,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","count":3,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":3.27e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10642","display_name":"Atmospheric-Pressure Plasma Applications","value":3.06e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","value":2.53e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13249","display_name":"Dielectric properties of ceramics","value":2.52e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":2.49e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","score":0.7307901382446289},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.689786970615387},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.6661842465400696},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.4712686240673065},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.13231328129768372}],"counts_by_year":[{"year":1994,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1995,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":5,"oa_works_count":2,"cited_by_count":0},{"year":1997,"works_count":5,"oa_works_count":4,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Kouichi ONO","Kouichi Ono Kouichi Ono"],"block_key":"k ono","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110186838","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}
