{"id":"https://openalex.org/A5110179460","orcid":null,"observed_orcids":[],"display_name":"Osamu Igarashi","raw_author_names":["OSAMU IGARASHI","Osamu Igarashi","Osamu Igarashi Osamu Igarashi"],"full_name":"Osamu Igarashi Osamu Igarashi","works_count":25,"cited_by_count":355,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":12,"i10_index":15},"ids":{"openalex":"https://openalex.org/A5110179460","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210125446","ror":"https://ror.org/02xnwme44","display_name":"Ulvac (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125446"]},"years":[1994]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":17,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10939","display_name":"Crystal Structures and Properties","count":8,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","value":0.0001081,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":9.14e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","value":4.42e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":3.44e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":2.68e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.702558159828186},{"id":"8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","score":0.687485933303833},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.5254972577095032},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.37770789861679077},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.21833553910255432}],"counts_by_year":[{"year":1969,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1970,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1971,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1972,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1976,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1977,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1978,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1985,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1988,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1992,"works_count":3,"oa_works_count":3,"cited_by_count":0},{"year":1993,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1994,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1997,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["OSAMU IGARASHI","Osamu Igarashi","Osamu Igarashi Osamu Igarashi"],"block_key":"o igarashi","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110179460","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}