{"id":"https://openalex.org/A5110149778","orcid":null,"observed_orcids":[],"display_name":"Sergey S. Borisov","raw_author_names":["S Borisov","S. Borisov","S. S. Borisov","Sergey Borisov","Sergey S. Borisov"],"full_name":"Sergey S. Borisov","works_count":34,"cited_by_count":302,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":9,"i10_index":9},"ids":{"openalex":"https://openalex.org/A5110149778","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I19880235","ror":"https://ror.org/010pmpe69","display_name":"Lomonosov Moscow State University","country_code":"RU","type":"education","lineage":["https://openalex.org/I19880235"]},"years":[2007,2006,2004,2003]},{"institution":{"id":"https://openalex.org/I4210098048","ror":"https://ror.org/00xfzhw50","display_name":"Abeam Technologies (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210098048"]},"years":[2018,2017,2016,2015,2013,2012,2010,2009,2008,2006]}],"last_known_institutions":[{"id":"https://openalex.org/I4210098048","ror":"https://ror.org/00xfzhw50","display_name":"Abeam Technologies (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210098048"]}],"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":30,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":21,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","count":16,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":7,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","count":6,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":0.0001887,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","value":9.33e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":8.58e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","value":8.26e-05,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":5.5e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.6621643900871277},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.6580396890640259},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6050075888633728},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.31082022190093994},{"id":"105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","score":0.14145761728286743}],"counts_by_year":[{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2009,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":4,"oa_works_count":0,"cited_by_count":17},{"year":2013,"works_count":3,"oa_works_count":0,"cited_by_count":17},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":26},{"year":2016,"works_count":2,"oa_works_count":0,"cited_by_count":24},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":28},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":23},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":39},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":4}],"display_name_alternatives":["S Borisov","S. Borisov","S. S. Borisov","Sergey Borisov","Sergey S. Borisov"],"block_key":"s borisov","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110149778","updated_date":"2026-10-28T12:34:19","created_date":"2016-06-24T00:00:00"}