{"id":"https://openalex.org/A5110143711","orcid":null,"observed_orcids":[],"display_name":"Peter F. Mueller","raw_author_names":["Mueller, P. F.","P. F. Mueller","P. Mueller","P.. F. Mueller","Peter F. Mueller"],"full_name":"Peter F. Mueller","works_count":17,"cited_by_count":112,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":4,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5110143711","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210111149","ror":"https://ror.org/01nph4h53","display_name":"Aerodyne Research","country_code":"US","type":"company","lineage":["https://openalex.org/I4210111149"]},"years":[1984,1983,1982,1981,1980]},{"institution":{"id":"https://openalex.org/I82514191","ror":"https://ror.org/02t71h845","display_name":"Honeywell (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I82514191"]},"years":[1986]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","count":11,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11050","display_name":"Photorefractive and Nonlinear Optics","count":4,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","count":4,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","value":7.08e-05,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12611","display_name":"Neural Networks and Reservoir Computing","value":4.23e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","value":3.87e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":2.26e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","value":2.01e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7830133438110352},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7331297397613525},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.6579737663269043},{"id":"115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","score":0.5140817761421204},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3335615396499634}],"counts_by_year":[{"year":1967,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1969,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1971,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1977,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1980,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1981,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1982,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1983,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1984,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1986,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":4}],"display_name_alternatives":["Mueller, P. F.","P. F. Mueller","P. Mueller","P.. F. Mueller","Peter F. Mueller"],"block_key":"p mueller","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110143711","updated_date":"2026-10-28T12:34:19","created_date":"2016-06-24T00:00:00"}