{"id":"https://openalex.org/A5110106443","orcid":null,"observed_orcids":[],"display_name":"Masis M. Mkrtchyan","raw_author_names":["M M Mkrtchyan","M. M. Mkrtchyan","M. Mkrtchyan","M.M. Mkrtchyan","Masis M. Mkrtchyan","Masis Mkrtchyan"],"full_name":"Masis M. Mkrtchyan","works_count":49,"cited_by_count":294,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":9,"i10_index":9},"ids":{"openalex":"https://openalex.org/A5110106443","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I114662689","ror":"https://ror.org/012cvds63","display_name":"Leidos (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I114662689"]},"years":[2013,2012,2010]},{"institution":{"id":"https://openalex.org/I1283103587","ror":"https://ror.org/02bbd5539","display_name":"AT&T (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]},"years":[1996,1995,1994]},{"institution":{"id":"https://openalex.org/I4387152956","ror":"https://ror.org/024850w61","display_name":"Alcatel-Lucent (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I2738502077","https://openalex.org/I4210149358","https://openalex.org/I4387152956"]},"years":[2000,1999,1998,1997]},{"institution":{"id":"https://openalex.org/I880747138","ror":"https://ror.org/00zv91802","display_name":"Science Applications International Corporation (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I880747138"]},"years":[2013,2012,2010]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":39,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":17,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11367","display_name":"Particle accelerators and beam dynamics","count":13,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","count":10,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","count":7,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":0.0003507,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","value":6.14e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":4.87e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","value":4.25e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","value":4.1e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","score":0.8009504675865173},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.790046215057373},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7676972150802612},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7182067632675171},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5753981471061707}],"counts_by_year":[{"year":1970,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1973,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1974,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1976,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1978,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1979,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":4},{"year":2013,"works_count":3,"oa_works_count":0,"cited_by_count":8},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["M M Mkrtchyan","M. M. Mkrtchyan","M. Mkrtchyan","M.M. Mkrtchyan","Masis M. Mkrtchyan","Masis Mkrtchyan"],"block_key":"m mkrtchyan","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110106443","updated_date":"2026-10-31T12:29:50","created_date":"2025-10-10T00:00:00"}