{"id":"https://openalex.org/A5110099337","orcid":null,"observed_orcids":[],"display_name":"T. Kaneyama","raw_author_names":["T Kaneyama","T. Kaneyama","Toshikatsu KANEYAMA","Toshikatsu Kaneyama","\u91d1\u5c71 \u4fca\u514b"],"full_name":"Kaneyama, Toshikatsu","works_count":79,"cited_by_count":1340,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":18,"i10_index":27},"ids":{"openalex":"https://openalex.org/A5110099337","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I114531698","ror":"https://ror.org/0112mx960","display_name":"Tokyo Institute of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698","https://openalex.org/I4400009020"]},"years":[2010,2009]},{"institution":{"id":"https://openalex.org/I129923673","ror":"https://ror.org/02zme4e72","display_name":"JEOL (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]},"years":[2015,2014,2013,2012,2011,2010,2009,2008,2007,2006,2005,2004,2003,2002,2001,2000,1999,1998,1997,1994,1993,1992,1991,1989]},{"institution":{"id":"https://openalex.org/I148283060","ror":"https://ror.org/02jbv0t02","display_name":"Lawrence Berkeley National Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},"years":[1992]},{"institution":{"id":"https://openalex.org/I201537933","ror":"https://ror.org/01dq60k83","display_name":"Tohoku University","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},"years":[2009]},{"institution":{"id":"https://openalex.org/I4210086780","ror":"https://ror.org/00097mb19","display_name":"Japan Science and Technology Agency","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]},"years":[2011,2010,2009,2008,2007]},{"institution":{"id":"https://openalex.org/I4210093476","ror":"https://ror.org/00h7gyj76","display_name":"Sumitomo Metal Mining (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210093476"]},"years":[2009]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","count":76,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":72,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","count":57,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","count":4,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":0.000741,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","value":0.0004072,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":0.0002143,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","value":6.42e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","value":2.25e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8736613988876343},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8155122995376587},{"id":"147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","score":0.6410432457923889},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5887147784233093},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.3106108605861664}],"counts_by_year":[{"year":1989,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1990,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1993,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":1994,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2003,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2004,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2007,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":8,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":12,"oa_works_count":4,"cited_by_count":0},{"year":2012,"works_count":3,"oa_works_count":2,"cited_by_count":131},{"year":2013,"works_count":2,"oa_works_count":1,"cited_by_count":88},{"year":2014,"works_count":3,"oa_works_count":1,"cited_by_count":86},{"year":2015,"works_count":4,"oa_works_count":2,"cited_by_count":115},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":104},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":78},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":64},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":60},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":53},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":53},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":37},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":37},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":38},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":26}],"display_name_alternatives":["T Kaneyama","T. Kaneyama","Toshikatsu KANEYAMA","Toshikatsu Kaneyama","\u91d1\u5c71 \u4fca\u514b"],"block_key":"t kaneyama","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110099337","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5110099337","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}