{"id":"https://openalex.org/A5110084702","orcid":"https://orcid.org/0009-0008-3231-8706","observed_orcids":["https://orcid.org/0009-0008-3231-8706"],"display_name":"Tianhua Zou","raw_author_names":["T. H. Zou","T.H. Zou","Tian-Hua Zou","Tianhua Zou","Tian\u2010Hua Zou"],"full_name":"Tianhua Zou","works_count":22,"cited_by_count":766,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":16,"i10_index":18},"ids":{"openalex":"https://openalex.org/A5110084702","orcid":"https://orcid.org/0009-0008-3231-8706","observed_orcids":["https://orcid.org/0009-0008-3231-8706"]},"affiliations":[{"institution":{"id":"https://openalex.org/I100066346","ror":"https://ror.org/04vnq7t77","display_name":"University of Stuttgart","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]},"years":[2018,2017,2016,2015]},{"institution":{"id":"https://openalex.org/I19820366","ror":"https://ror.org/034t30j35","display_name":"Chinese Academy of Sciences","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},"years":[2016,2015,2014,2013]},{"institution":{"id":"https://openalex.org/I4210154057","ror":"https://ror.org/04j3eks61","display_name":"Institute of Solid State Physics","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210154057"]},"years":[2016,2015,2014,2013]}],"last_known_institutions":[{"id":"https://openalex.org/I100066346","ror":"https://ror.org/04vnq7t77","display_name":"University of Stuttgart","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","count":22,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","count":18,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","value":0.0001508,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","value":0.0001168,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","value":0.0001027,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12200","display_name":"Heusler alloys: electronic and magnetic properties","value":3.78e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":3.51e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8835709691047668},{"id":"63024428","wikidata":"https://www.wikidata.org/wiki/Q552456","display_name":"Thermoelectric effect","score":0.8682530522346497},{"id":"207365445","wikidata":"https://www.wikidata.org/wiki/Q15020929","display_name":"Thermoelectric materials","score":0.6044687032699585},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.33133628964424133},{"id":"97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","score":0.28767967224121094}],"counts_by_year":[{"year":2013,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2014,"works_count":4,"oa_works_count":0,"cited_by_count":12},{"year":2015,"works_count":8,"oa_works_count":2,"cited_by_count":48},{"year":2016,"works_count":2,"oa_works_count":1,"cited_by_count":76},{"year":2017,"works_count":2,"oa_works_count":1,"cited_by_count":69},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":68},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":64},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":96},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":77},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":64},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":68},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":44},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":45},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":35}],"display_name_alternatives":["T. H. Zou","T.H. Zou","Tian-Hua Zou","Tianhua Zou","Tian\u2010Hua Zou"],"block_key":"t zou","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110084702","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5110084702","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}