{"id":"https://openalex.org/A5110067512","orcid":"https://orcid.org/0009-0008-1265-5457","observed_orcids":["https://orcid.org/0009-0008-1265-5457"],"display_name":"Kwanghui Shin","raw_author_names":["Kwanghui Shin"],"full_name":"Kwanghui Shin","works_count":4,"cited_by_count":1,"summary_stats":{"2yr_mean_citedness":0.25,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5110067512","orcid":"https://orcid.org/0009-0008-1265-5457","observed_orcids":["https://orcid.org/0009-0008-1265-5457"]},"affiliations":[{"institution":{"id":"https://openalex.org/I28615091","ror":"https://ror.org/032xf8h46","display_name":"Kyonggi University","country_code":"KR","type":"education","lineage":["https://openalex.org/I28615091"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I28615091","ror":"https://ror.org/032xf8h46","display_name":"Kyonggi University","country_code":"KR","type":"education","lineage":["https://openalex.org/I28615091"]}],"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":3,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","count":1,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","count":1,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","value":1.33e-05,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","value":1.22e-05,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","value":1.04e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":1e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":8.1e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","score":0.8184999823570251},{"id":"43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","score":0.7203999757766724},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5134000182151794},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5120999813079834},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4675000011920929}],"counts_by_year":[{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2026,"works_count":3,"oa_works_count":2,"cited_by_count":1}],"display_name_alternatives":["Kwanghui Shin"],"block_key":"k shin","works_api_url":"https://api.openalex.org/works?filter=author.id:A5110067512","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5110067512","updated_date":"2026-11-10T14:30:39","created_date":"2025-10-24T00:00:00"}