{"id":"https://openalex.org/A5106733355","orcid":null,"observed_orcids":[],"display_name":"Simona Liukaityt\u0117","raw_author_names":["Liukaityte, Simona","S Liukaityte","S. Liukaityte","Simona Liukaityte","Simona Liukaityt\u0117"],"full_name":"Liukaityte, Simona","works_count":46,"cited_by_count":165,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":7,"i10_index":6},"ids":{"openalex":"https://openalex.org/A5106733355","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2017,2016,2015,2014,2013]},{"institution":{"id":"https://openalex.org/I173212132","ror":"https://ror.org/03nadee84","display_name":"Vilnius University","country_code":"LT","type":"education","lineage":["https://openalex.org/I173212132"]},"years":[2013,2012,2011]},{"institution":{"id":"https://openalex.org/I21491767","ror":"https://ror.org/035xkbk20","display_name":"Aix-Marseille Universit\u00e9","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},"years":[2017,2016,2015,2014,2013]},{"institution":{"id":"https://openalex.org/I4210125985","ror":"https://ror.org/03br1wy20","display_name":"Institut Fresnel","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210095849","https://openalex.org/I4210125985","https://openalex.org/I4210142724"]},"years":[2019,2018,2017,2016,2015,2014,2013]},{"institution":{"id":"https://openalex.org/I4210142724","ror":"https://ror.org/040baw385","display_name":"Centrale M\u00e9diterran\u00e9e","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210142724"]},"years":[2017,2016,2015,2014,2013]}],"last_known_institutions":[{"id":"https://openalex.org/I4210125985","ror":"https://ror.org/03br1wy20","display_name":"Institut Fresnel","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210095849","https://openalex.org/I4210125985","https://openalex.org/I4210142724"]}],"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":34,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","count":28,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","count":24,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","count":6,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":0.0002827,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","value":0.0002596,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","value":0.0002305,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","value":5.27e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13493","display_name":"Optical and Acousto-Optic Technologies","value":4.83e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8791334629058838},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8486599922180176},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.784500002861023},{"id":"191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","score":0.7800357341766357},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5308004021644592}],"counts_by_year":[{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2013,"works_count":6,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":3,"oa_works_count":1,"cited_by_count":6},{"year":2015,"works_count":12,"oa_works_count":1,"cited_by_count":17},{"year":2016,"works_count":14,"oa_works_count":1,"cited_by_count":10},{"year":2017,"works_count":6,"oa_works_count":1,"cited_by_count":16},{"year":2018,"works_count":2,"oa_works_count":1,"cited_by_count":20},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":15},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":19},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":5}],"display_name_alternatives":["Liukaityte, Simona","S Liukaityte","S. Liukaityte","Simona Liukaityte","Simona Liukaityt\u0117"],"block_key":"s liukaityte","works_api_url":"https://api.openalex.org/works?filter=author.id:A5106733355","updated_date":"2026-10-28T12:34:19","created_date":"2016-06-24T00:00:00"}