{"id":"https://openalex.org/A5103226166","orcid":"https://orcid.org/0000-0001-6096-8919","observed_orcids":["https://orcid.org/0000-0001-6096-8919"],"display_name":"Aishik Acharya","raw_author_names":["A. Acharya","A. Aishik Acharya","AISHIK ACHARYA","Acharya, Aishik","Aishik Acharya"],"full_name":"Aishik Acharya","works_count":30,"cited_by_count":231,"summary_stats":{"2yr_mean_citedness":0.45454545454545453,"h_index":7,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5103226166","orcid":"https://orcid.org/0000-0001-6096-8919","observed_orcids":["https://orcid.org/0000-0001-6096-8919"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1340206300","ror":"https://ror.org/05k37v296","display_name":"Defence Research and Development Organisation","country_code":"IN","type":"government","lineage":["https://openalex.org/I1340206300","https://openalex.org/I2799351866","https://openalex.org/I4210150591"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I4210107353","ror":"https://ror.org/01v791m31","display_name":"NEC (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I118347220","https://openalex.org/I4210107353"]},"years":[1997]},{"institution":{"id":"https://openalex.org/I4210138561","ror":"https://ror.org/03mw5zj47","display_name":"Research Centre Imarat","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1340206300","https://openalex.org/I2799351866","https://openalex.org/I4210138561","https://openalex.org/I4210150591"]},"years":[2020,2019]},{"institution":{"id":"https://openalex.org/I4210150591","ror":"https://ror.org/03wejsv15","display_name":"Ministry of Defence","country_code":"IN","type":"government","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210150591"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I4210159890","ror":"https://ror.org/05h2r8y34","display_name":"TCG Crest","country_code":"IN","type":"other","lineage":["https://openalex.org/I4210159890"]},"years":[2026,2025,2024]},{"institution":{"id":"https://openalex.org/I66760702","ror":"https://ror.org/021wm7p51","display_name":"Council of Scientific and Industrial Research","country_code":"IN","type":"government","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210134808","https://openalex.org/I66760702"]},"years":[2020,2017,2016,2015,2014,2013,2012]},{"institution":{"id":"https://openalex.org/I88910343","ror":"https://ror.org/0307k1x46","display_name":"CSIR National Physical Laboratory of India","country_code":"IN","type":"facility","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210134808","https://openalex.org/I66760702","https://openalex.org/I88910343"]},"years":[2020,2017,2016,2015,2014,2013,2012]},{"institution":{"id":"https://openalex.org/I99364266","ror":"https://ror.org/053rcsq61","display_name":"Academy of Scientific and Innovative Research","country_code":"IN","type":"education","lineage":["https://openalex.org/I99364266"]},"years":[2016]}],"last_known_institutions":[{"id":"https://openalex.org/I4210159890","ror":"https://ror.org/05h2r8y34","display_name":"TCG Crest","country_code":"IN","type":"other","lineage":["https://openalex.org/I4210159890"]}],"topics":[{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","count":21,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10425","display_name":"Cold Atom Physics and Bose-Einstein Condensates","count":8,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":6,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","value":0.0003207,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11993","display_name":"Atomic and Subatomic Physics Research","value":8.04e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10425","display_name":"Cold Atom Physics and Bose-Einstein Condensates","value":7.12e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":6.07e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","value":4.2e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8063730001449585},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7824000120162964},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7290999889373779},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.5453996658325195},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.48380178213119507}],"counts_by_year":[{"year":1997,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":3,"oa_works_count":0,"cited_by_count":7},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":6},{"year":2016,"works_count":5,"oa_works_count":0,"cited_by_count":9},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":8},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":6},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":16},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2024,"works_count":4,"oa_works_count":3,"cited_by_count":10},{"year":2025,"works_count":3,"oa_works_count":1,"cited_by_count":7},{"year":2026,"works_count":4,"oa_works_count":3,"cited_by_count":8}],"display_name_alternatives":["A. Acharya","A. Aishik Acharya","AISHIK ACHARYA","Acharya, Aishik","Aishik Acharya"],"block_key":"a acharya","works_api_url":"https://api.openalex.org/works?filter=author.id:A5103226166","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5103226166","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}