{"id":"https://openalex.org/A5102141069","orcid":null,"observed_orcids":[],"display_name":"Yanjing Ou","raw_author_names":["Ou Yanjing","Ou, Yanjing","Yanjing Ou","Yanjing Ou,"],"full_name":"Yanjing Ou","works_count":17,"cited_by_count":466,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":12,"i10_index":14},"ids":{"openalex":"https://openalex.org/A5102141069","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I165932596","ror":"https://ror.org/01tgyzw49","display_name":"National University of Singapore","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I172675005","ror":"https://ror.org/02e7b5302","display_name":"Nanyang Technological University","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]},"years":[2014,2012,2011,2010]},{"institution":{"id":"https://openalex.org/I4210091207","ror":"https://ror.org/00f44np30","display_name":"Singapore Institute of Manufacturing Technology","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210091207","https://openalex.org/I91275662"]},"years":[2016,2015,2014]}],"last_known_institutions":[{"id":"https://openalex.org/I4210091207","ror":"https://ror.org/00f44np30","display_name":"Singapore Institute of Manufacturing Technology","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210091207","https://openalex.org/I91275662"]}],"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":17,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","count":16,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13500","display_name":"Probability and Statistical Research","count":6,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12905","display_name":"Management Systems and Quality Improvement","count":4,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13706","display_name":"Management and Optimization Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","value":0.0001884,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":5.67e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12814","display_name":"Gaussian Processes and Bayesian Inference","value":1.52e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12905","display_name":"Management Systems and Quality Improvement","value":1.43e-05,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","value":1.18e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","score":0.702141284942627},{"id":"105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","score":0.6420866847038269},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6157017946243286},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.548423171043396},{"id":"111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","score":0.061355262994766235}],"counts_by_year":[{"year":2010,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":9},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2014,"works_count":5,"oa_works_count":0,"cited_by_count":67},{"year":2015,"works_count":2,"oa_works_count":0,"cited_by_count":37},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":47},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":40},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":26},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":35},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":30},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":37},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":10}],"display_name_alternatives":["Ou Yanjing","Ou, Yanjing","Yanjing Ou","Yanjing Ou,"],"block_key":"y ou","works_api_url":"https://api.openalex.org/works?filter=author.id:A5102141069","updated_date":"2026-10-27T12:30:23","created_date":"2016-06-24T00:00:00"}