{"id":"https://openalex.org/A5101933714","orcid":"https://orcid.org/0000-0002-7325-8585","observed_orcids":["https://orcid.org/0000-0002-7325-8585"],"display_name":"Donghyun Kim","raw_author_names":["Donghyun Kim"],"full_name":"Kim, Donghyun","works_count":12,"cited_by_count":66,"summary_stats":{"2yr_mean_citedness":4.833333333333333,"h_index":3,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5101933714","orcid":"https://orcid.org/0000-0002-7325-8585","observed_orcids":["https://orcid.org/0000-0002-7325-8585"]},"affiliations":[{"institution":{"id":"https://openalex.org/I21028721","ror":"https://ror.org/005bty106","display_name":"Eulji University","country_code":"KR","type":"education","lineage":["https://openalex.org/I21028721"]},"years":[2026,2025,2024,2023]},{"institution":{"id":"https://openalex.org/I848706","ror":"https://ror.org/04q78tk20","display_name":"Sungkyunkwan University","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]},"years":[2020]}],"last_known_institutions":[{"id":"https://openalex.org/I21028721","ror":"https://ror.org/005bty106","display_name":"Eulji University","country_code":"KR","type":"education","lineage":["https://openalex.org/I21028721"]}],"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":4,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":2,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13715","display_name":"Power Line Inspection Robots","value":4.08e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","value":3.63e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":1.61e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12435","display_name":"Bladed Disk Vibration Dynamics","value":1.44e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","value":1.25e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7773514986038208},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.5733000040054321},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5726000070571899},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.473755419254303},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.34291720390319824}],"counts_by_year":[{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":8},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":14},{"year":2025,"works_count":3,"oa_works_count":3,"cited_by_count":21},{"year":2026,"works_count":2,"oa_works_count":2,"cited_by_count":19}],"display_name_alternatives":["Donghyun Kim"],"block_key":"d kim","works_api_url":"https://api.openalex.org/works?filter=author.id:A5101933714","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5101933714","updated_date":"2026-11-11T13:02:13","created_date":"2016-06-24T00:00:00"}