{"id":"https://openalex.org/A5100455126","orcid":"https://orcid.org/0000-0001-9993-4986","observed_orcids":["https://orcid.org/0000-0001-9993-4986"],"display_name":"Hang Li","raw_author_names":["Hang Li","Li Hang"],"full_name":"Hang Li","works_count":31,"cited_by_count":341,"summary_stats":{"2yr_mean_citedness":15.7,"h_index":8,"i10_index":8},"ids":{"openalex":"https://openalex.org/A5100455126","orcid":"https://orcid.org/0000-0001-9993-4986","observed_orcids":["https://orcid.org/0000-0001-9993-4986"]},"affiliations":[{"institution":{"id":"https://openalex.org/I103635307","ror":"https://ror.org/03nawhv43","display_name":"University of California, Riverside","country_code":"US","type":"education","lineage":["https://openalex.org/I103635307"]},"years":[2005]},{"institution":{"id":"https://openalex.org/I106165777","ror":"https://ror.org/036nfer12","display_name":"University of Central Florida","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]},"years":[2021,2019,2018,2017,2016]},{"institution":{"id":"https://openalex.org/I155093810","ror":"https://ror.org/03hbp5t65","display_name":"University of Idaho","country_code":"US","type":"education","lineage":["https://openalex.org/I155093810"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I16609230","ror":"https://ror.org/05htk5m33","display_name":"Hunan University","country_code":"CN","type":"education","lineage":["https://openalex.org/I16609230"]},"years":[2016]},{"institution":{"id":"https://openalex.org/I201537933","ror":"https://ror.org/01dq60k83","display_name":"Tohoku University","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I39333907","ror":"https://ror.org/02txfnf15","display_name":"Yanshan University","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]},"years":[2025,2024]},{"institution":{"id":"https://openalex.org/I4210124427","ror":"https://ror.org/02vdh2x09","display_name":"City College of Dongguan University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I2799850029","https://openalex.org/I4210124427"]},"years":[2020]},{"institution":{"id":"https://openalex.org/I4210140493","ror":"https://ror.org/04ttadj76","display_name":"Collaborative Innovation Center of Advanced Microstructures","country_code":"CN","type":"facility","lineage":["https://openalex.org/I126520041","https://openalex.org/I183067930","https://openalex.org/I19820366","https://openalex.org/I24943067","https://openalex.org/I2802624667","https://openalex.org/I4210140493","https://openalex.org/I76130692","https://openalex.org/I881766915"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I4391767811","ror":"https://ror.org/00g51hv48","display_name":"State Key Laboratory of Metastable Materials Science and Technology","country_code":"CN","type":"facility","lineage":["https://openalex.org/I39333907","https://openalex.org/I4391767811"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I4405286224","ror":"https://ror.org/01gpt6p30","display_name":"Advanced Institute for Materials Research, Tohoku University","country_code":"JP","type":"facility","lineage":["https://openalex.org/I201537933","https://openalex.org/I4405286224"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I50760025","ror":"https://ror.org/0576gt767","display_name":"Hangzhou Dianzi University","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]},"years":[2025,2022]},{"institution":{"id":"https://openalex.org/I881766915","ror":"https://ror.org/01rxvg760","display_name":"Nanjing University","country_code":"CN","type":"education","lineage":["https://openalex.org/I881766915"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I99065089","ror":"https://ror.org/03cve4549","display_name":"Tsinghua University","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},"years":[2025]}],"last_known_institutions":[{"id":"https://openalex.org/I39333907","ror":"https://ror.org/02txfnf15","display_name":"Yanshan University","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]},{"id":"https://openalex.org/I4391767811","ror":"https://ror.org/00g51hv48","display_name":"State Key Laboratory of Metastable Materials Science and Technology","country_code":"CN","type":"facility","lineage":["https://openalex.org/I39333907","https://openalex.org/I4391767811"]},{"id":"https://openalex.org/I50760025","ror":"https://ror.org/0576gt767","display_name":"Hangzhou Dianzi University","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]},{"id":"https://openalex.org/I99065089","ror":"https://ror.org/03cve4549","display_name":"Tsinghua University","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10030","display_name":"Electrocatalysts for Energy Conversion","count":5,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","value":0.0004114,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13720","display_name":"Benford\u2019s Law and Fraud Detection","value":3.98e-05,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","value":3.55e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","value":3.26e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":3.21e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8755435943603516},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7537999749183655},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.6316590905189514},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.5369669198989868},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.526769757270813}],"counts_by_year":[{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2016,"works_count":2,"oa_works_count":1,"cited_by_count":2},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2018,"works_count":4,"oa_works_count":3,"cited_by_count":8},{"year":2019,"works_count":2,"oa_works_count":1,"cited_by_count":18},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":14},{"year":2021,"works_count":2,"oa_works_count":0,"cited_by_count":20},{"year":2022,"works_count":3,"oa_works_count":2,"cited_by_count":13},{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":12},{"year":2024,"works_count":3,"oa_works_count":2,"cited_by_count":26},{"year":2025,"works_count":7,"oa_works_count":3,"cited_by_count":95},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":97}],"display_name_alternatives":["Hang Li","Li Hang"],"block_key":"h li","works_api_url":"https://api.openalex.org/works?filter=author.id:A5100455126","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5100455126","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}