{"id":"https://openalex.org/A5100345323","orcid":null,"observed_orcids":[],"display_name":"Qianchun Li","raw_author_names":["Qianchun Li"],"full_name":"Qianchun Li","works_count":3,"cited_by_count":38,"summary_stats":{"2yr_mean_citedness":1.0,"h_index":2,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5100345323","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I177739611","ror":"https://ror.org/05bhmhz54","display_name":"Yangtze University","country_code":"CN","type":"education","lineage":["https://openalex.org/I177739611"]},"years":[2023]},{"institution":{"id":"https://openalex.org/I196699116","ror":"https://ror.org/03fe7t173","display_name":"Wuhan University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I196699116"]},"years":[2026,2025]}],"last_known_institutions":[{"id":"https://openalex.org/I196699116","ror":"https://ror.org/03fe7t173","display_name":"Wuhan University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I196699116"]}],"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","count":1,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10719","display_name":"3D Shape Modeling and Analysis","count":1,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":1,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":9.8e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":4.9e-06,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11099","display_name":"Autonomous Vehicle Technology and Safety","value":4.7e-06,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":4e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10719","display_name":"3D Shape Modeling and Analysis","value":4e-06,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8080666065216064},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.6495979428291321},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.5745357871055603},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.3693453073501587},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2721000015735626}],"counts_by_year":[{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":36},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":0}],"display_name_alternatives":["Qianchun Li"],"block_key":"q li","works_api_url":"https://api.openalex.org/works?filter=author.id:A5100345323","updated_date":"2026-10-15T12:44:11","created_date":"2025-10-10T00:00:00"}