{"id":"https://openalex.org/A5093784791","orcid":null,"observed_orcids":[],"display_name":"Liangze Mao","raw_author_names":["Liangze Mao","Mao, Liangze"],"full_name":"Mao, Liangze","works_count":3,"cited_by_count":7,"summary_stats":{"2yr_mean_citedness":2.3333333333333335,"h_index":2,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5093784791","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4391767896","ror":"https://ror.org/01t8xrx60","display_name":"State Key Laboratory of New Ceramics and Fine Processing","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4391767896","https://openalex.org/I99065089"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I99065089","ror":"https://ror.org/03cve4549","display_name":"Tsinghua University","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},"years":[2025,2024]}],"last_known_institutions":[{"id":"https://openalex.org/I99065089","ror":"https://ror.org/03cve4549","display_name":"Tsinghua University","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","count":1,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":2.61e-05,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","value":1.08e-05,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","value":7.8e-06,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","value":7.5e-06,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":6e-06,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","score":0.7504047155380249},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.4776521921157837},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.38066181540489197},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.3632965087890625},{"id":"126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","score":0.2500843405723572}],"counts_by_year":[{"year":2024,"works_count":2,"oa_works_count":2,"cited_by_count":1},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["Liangze Mao","Mao, Liangze"],"block_key":"l mao","works_api_url":"https://api.openalex.org/works?filter=author.id:A5093784791","updated_date":"2026-11-07T12:08:38","created_date":"2024-05-30T00:00:00"}