{"id":"https://openalex.org/A5093733671","orcid":"https://orcid.org/0009-0002-0331-7428","observed_orcids":["https://orcid.org/0009-0002-0331-7428"],"display_name":"Dominik Dragoun","raw_author_names":["Dominik Dragoun","Dragoun, Dominik"],"full_name":"Dominik Dragoun","works_count":2,"cited_by_count":3,"summary_stats":{"2yr_mean_citedness":3.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5093733671","orcid":"https://orcid.org/0009-0002-0331-7428","observed_orcids":["https://orcid.org/0009-0002-0331-7428"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210162199","ror":"https://ror.org/05gwtvp11","display_name":"Nuclear Research Institute Rez (Czechia)","country_code":"CZ","type":"company","lineage":["https://openalex.org/I4210162199"]},"years":[2024]}],"last_known_institutions":[{"id":"https://openalex.org/I4210162199","ror":"https://ror.org/05gwtvp11","display_name":"Nuclear Research Institute Rez (Czechia)","country_code":"CZ","type":"company","lineage":["https://openalex.org/I4210162199"]}],"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":1.01e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11666","display_name":"Color Science and Applications","value":7.1e-06,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","value":4.9e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.6e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13923","display_name":"Nuclear and radioactivity studies","value":2.6e-06,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","score":0.5985202789306641},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.3237999975681305},{"id":"106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","score":0.19499999284744263},{"id":"116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","score":0.1914999932050705},{"id":"105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","score":0.0}],"counts_by_year":[{"year":2015,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Dominik Dragoun","Dragoun, Dominik"],"block_key":"d dragoun","works_api_url":"https://api.openalex.org/works?filter=author.id:A5093733671","awards_count":0,"updated_date":"2026-11-06T12:48:51","created_date":"2024-01-18T00:00:00"}