{"id":"https://openalex.org/A5092931600","orcid":"https://orcid.org/0009-0006-5303-904X","observed_orcids":["https://orcid.org/0009-0006-5303-904X"],"display_name":"John Dickhoff","raw_author_names":["John Dickhoff"],"full_name":"John Dickhoff","works_count":2,"cited_by_count":8,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":2,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5092931600","orcid":"https://orcid.org/0009-0006-5303-904X","observed_orcids":["https://orcid.org/0009-0006-5303-904X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1343180700","ror":"https://ror.org/01ek73717","display_name":"Intel (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},"years":[2023]}],"last_known_institutions":[{"id":"https://openalex.org/I1343180700","ror":"https://ror.org/01ek73717","display_name":"Intel (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":2,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":2.09e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":1.73e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":1.42e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","value":3.5e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","score":0.7129530906677246},{"id":"134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","score":0.3777652680873871},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.24473494291305542},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.20746126770973206},{"id":"111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","score":0.0}],"counts_by_year":[{"year":2023,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["John Dickhoff"],"block_key":"j dickhoff","works_api_url":"https://api.openalex.org/works?filter=author.id:A5092931600","updated_date":"2026-11-04T11:47:51","created_date":"2023-09-25T00:00:00"}