{"id":"https://openalex.org/A5090200481","orcid":"https://orcid.org/0000-0003-0841-3400","observed_orcids":["https://orcid.org/0000-0003-0841-3400"],"display_name":"Vitor Furtado Paes","raw_author_names":["Vitor F Paes","Vitor F. Paes","Vitor Furtado Paes"],"full_name":"Vitor Furtado Paes","works_count":11,"cited_by_count":13,"summary_stats":{"2yr_mean_citedness":0.25,"h_index":2,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5090200481","orcid":"https://orcid.org/0000-0003-0841-3400","observed_orcids":["https://orcid.org/0000-0003-0841-3400"]},"affiliations":[{"institution":{"id":"https://openalex.org/I110200422","ror":"https://ror.org/0176yjw32","display_name":"Universidade Federal de Minas Gerais","country_code":"BR","type":"education","lineage":["https://openalex.org/I110200422"]},"years":[2026,2025,2024,2021]}],"last_known_institutions":[{"id":"https://openalex.org/I110200422","ror":"https://ror.org/0176yjw32","display_name":"Universidade Federal de Minas Gerais","country_code":"BR","type":"education","lineage":["https://openalex.org/I110200422"]}],"topics":[{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","count":5,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":3,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","count":3,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","value":5.44e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","value":5.13e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","value":2.97e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","value":1.94e-05,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12994","display_name":"Infrared Thermography in Medicine","value":1.68e-05,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"x_concepts":[{"id":"165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","score":0.802299976348877},{"id":"62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","score":0.7003999948501587},{"id":"158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","score":0.567799985408783},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5120999813079834},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5074126124382019}],"counts_by_year":[{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2021,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":2,"oa_works_count":2,"cited_by_count":1},{"year":2025,"works_count":3,"oa_works_count":0,"cited_by_count":4},{"year":2026,"works_count":3,"oa_works_count":3,"cited_by_count":6}],"display_name_alternatives":["Vitor F Paes","Vitor F. Paes","Vitor Furtado Paes"],"block_key":"v paes","works_api_url":"https://api.openalex.org/works?filter=author.id:A5090200481","updated_date":"2026-11-05T13:29:08","created_date":"2020-12-21T00:00:00"}