{"id":"https://openalex.org/A5090200331","orcid":"https://orcid.org/0000-0001-8669-4469","observed_orcids":["https://orcid.org/0000-0001-8669-4469"],"display_name":"Sheng Yuan Hu","raw_author_names":["HU Sheng","Sheng Hu","Sheng Yuan Hu"],"full_name":"Sheng Yuan Hu","works_count":42,"cited_by_count":138,"summary_stats":{"2yr_mean_citedness":1.2,"h_index":7,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5090200331","orcid":"https://orcid.org/0000-0001-8669-4469","observed_orcids":["https://orcid.org/0000-0001-8669-4469"]},"affiliations":[{"institution":{"id":"https://openalex.org/I17442442","ror":"https://ror.org/05twwhs70","display_name":"State Grid Corporation of China (China)","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]},"years":[2024,2021]},{"institution":{"id":"https://openalex.org/I24943067","ror":"https://ror.org/013q1eq08","display_name":"Fudan University","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},"years":[2020]},{"institution":{"id":"https://openalex.org/I27599042","ror":"https://ror.org/03442p831","display_name":"Xi'an Polytechnic University","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]},"years":[2026,2025,2024,2023,2021,2020,2019]},{"institution":{"id":"https://openalex.org/I4387155567","ror":"https://ror.org/00e17m144","display_name":"State Grid Hunan Electric Power Company Limited","country_code":"CN","type":"company","lineage":["https://openalex.org/I4387155567"]},"years":[2024,2021]},{"institution":{"id":"https://openalex.org/I4391767673","ror":"https://ror.org/01mamgv83","display_name":"State Key Laboratory of ASIC and System","country_code":"CN","type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]},"years":[2020]},{"institution":{"id":"https://openalex.org/I50632499","ror":"https://ror.org/04vgbd477","display_name":"Chongqing University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I50632499"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I63354593","ror":"https://ror.org/043dxc061","display_name":"Sichuan Normal University","country_code":"CN","type":"education","lineage":["https://openalex.org/I63354593"]},"years":[2021]},{"institution":{"id":"https://openalex.org/I74525822","ror":"https://ror.org/02d3fj342","display_name":"Hubei University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I74525822"]},"years":[2026]},{"institution":{"id":"https://openalex.org/I87445476","ror":"https://ror.org/017zhmm22","display_name":"Xi'an Jiaotong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]},"years":[2018,2017,2016,2015,2014]}],"last_known_institutions":[{"id":"https://openalex.org/I27599042","ror":"https://ror.org/03442p831","display_name":"Xi'an Polytechnic University","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]},{"id":"https://openalex.org/I74525822","ror":"https://ror.org/02d3fj342","display_name":"Hubei University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I74525822"]}],"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":21,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","count":12,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":8,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14484","display_name":"Technology and Data Analysis","count":7,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11595","display_name":"Textile materials and evaluations","count":5,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14484","display_name":"Technology and Data Analysis","value":0.0035318,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","value":0.0001474,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":7.2e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13832","display_name":"Advanced Decision-Making Techniques","value":5.65e-05,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":3.7e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8486096858978271},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7315000295639038},{"id":"98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","score":0.6974217891693115},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3765999972820282},{"id":"111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","score":0.0}],"counts_by_year":[{"year":2013,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2014,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":3},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":3},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2020,"works_count":4,"oa_works_count":4,"cited_by_count":11},{"year":2021,"works_count":7,"oa_works_count":4,"cited_by_count":10},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2023,"works_count":5,"oa_works_count":2,"cited_by_count":19},{"year":2024,"works_count":7,"oa_works_count":3,"cited_by_count":27},{"year":2025,"works_count":5,"oa_works_count":2,"cited_by_count":26},{"year":2026,"works_count":3,"oa_works_count":1,"cited_by_count":18}],"display_name_alternatives":["HU Sheng","Sheng Hu","Sheng Yuan Hu"],"block_key":"s hu","works_api_url":"https://api.openalex.org/works?filter=author.id:A5090200331","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5090200331","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}