{"id":"https://openalex.org/A5089047840","orcid":"https://orcid.org/0000-0001-6079-5050","observed_orcids":["https://orcid.org/0000-0001-6079-5050"],"display_name":"Dominik Neumayr","raw_author_names":["D Neumayr","D. Neumayr","Dominik Neumayr","Neumayr, Dominik"],"full_name":"Neumayr, Dominik","works_count":30,"cited_by_count":1001,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":16,"i10_index":16},"ids":{"openalex":"https://openalex.org/A5089047840","orcid":"https://orcid.org/0000-0001-6079-5050","observed_orcids":["https://orcid.org/0000-0001-6079-5050"]},"affiliations":[{"institution":{"id":"https://openalex.org/I103163165","ror":"https://ror.org/05g3dte14","display_name":"Florida State University","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]},"years":[2013,2011]},{"institution":{"id":"https://openalex.org/I169521973","ror":"https://ror.org/05fs6jp91","display_name":"University of New Mexico","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},"years":[2021]},{"institution":{"id":"https://openalex.org/I35440088","ror":"https://ror.org/05a28rw58","display_name":"ETH Zurich","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]},"years":[2020,2019,2018,2017,2016,2011]}],"last_known_institutions":[{"id":"https://openalex.org/I169521973","ror":"https://ror.org/05fs6jp91","display_name":"University of New Mexico","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]}],"topics":[{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","count":21,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","count":14,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","count":9,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","value":7.09e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","value":5.04e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","value":5.04e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","value":4.67e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","value":3.87e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.659016489982605},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.6243279576301575},{"id":"163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","score":0.6011921167373657},{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.5607112050056458},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.5073685050010681}],"counts_by_year":[{"year":2011,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2016,"works_count":9,"oa_works_count":0,"cited_by_count":31},{"year":2017,"works_count":7,"oa_works_count":7,"cited_by_count":61},{"year":2018,"works_count":4,"oa_works_count":1,"cited_by_count":105},{"year":2019,"works_count":2,"oa_works_count":2,"cited_by_count":97},{"year":2020,"works_count":3,"oa_works_count":2,"cited_by_count":131},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":108},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":88},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":122},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":85},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":97},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":52}],"display_name_alternatives":["D Neumayr","D. Neumayr","Dominik Neumayr","Neumayr, Dominik"],"block_key":"d neumayr","works_api_url":"https://api.openalex.org/works?filter=author.id:A5089047840","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}