{"id":"https://openalex.org/A5088198298","orcid":null,"observed_orcids":[],"display_name":"LeiMa","raw_author_names":["LeiMa","Ma, Lei"],"full_name":"Ma, Lei","works_count":1,"cited_by_count":1,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5088198298","orcid":null,"observed_orcids":[]},"affiliations":[],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","value":1.1e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","value":5.9e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","value":4.3e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.30785423517227173},{"id":"115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","score":0.2409748136997223},{"id":"13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","score":0.0},{"id":"106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","score":0.0},{"id":"115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","score":0.0}],"counts_by_year":[{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":1}],"display_name_alternatives":["LeiMa","Ma, Lei"],"block_key":"l ma","works_api_url":"https://api.openalex.org/works?filter=author.id:A5088198298","updated_date":"2026-10-16T12:29:29","created_date":"2025-10-10T00:00:00"}