{"id":"https://openalex.org/A5087415568","orcid":"https://orcid.org/0009-0009-3483-4488","observed_orcids":["https://orcid.org/0009-0009-3483-4488"],"display_name":"Doyle T. Motes","raw_author_names":["Doyle T. Motes","Doyle T. Motes III"],"full_name":"Doyle T. Motes III","works_count":10,"cited_by_count":63,"summary_stats":{"2yr_mean_citedness":3.0,"h_index":4,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5087415568","orcid":"https://orcid.org/0009-0009-3483-4488","observed_orcids":["https://orcid.org/0009-0009-3483-4488"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210149909","ror":"https://ror.org/03r5ah485","display_name":"Texas Research Institute","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210149909"]},"years":[2025,2024,2023,2019]},{"institution":{"id":"https://openalex.org/I86519309","ror":"https://ror.org/00hj54h04","display_name":"The University of Texas at Austin","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]},"years":[2010]}],"last_known_institutions":[{"id":"https://openalex.org/I4210149909","ror":"https://ror.org/03r5ah485","display_name":"Texas Research Institute","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210149909"]}],"topics":[{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10707","display_name":"Cellular and Composite Structures","count":2,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10069","display_name":"Antenna Design and Analysis","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":3.98e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12699","display_name":"Electromagnetic Launch and Propulsion Technology","value":2.8e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","value":2.27e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","value":1.39e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","value":1.31e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8700869679450989},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5447770357131958},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5387414693832397},{"id":"24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","score":0.5096378326416016},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.24209064245224}],"counts_by_year":[{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2023,"works_count":4,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":7},{"year":2025,"works_count":3,"oa_works_count":1,"cited_by_count":20},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":20}],"display_name_alternatives":["Doyle T. Motes","Doyle T. Motes III"],"block_key":"d motes","works_api_url":"https://api.openalex.org/works?filter=author.id:A5087415568","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5087415568","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}