{"id":"https://openalex.org/A5086663453","orcid":"https://orcid.org/0000-0001-8235-9559","observed_orcids":["https://orcid.org/0000-0001-8235-9559"],"display_name":"Mengnan Ke","raw_author_names":["KE, MENGNAN","M. Ke","Mengnan Ke","Mengnang Ke"],"full_name":"Mengnan Ke","works_count":56,"cited_by_count":296,"summary_stats":{"2yr_mean_citedness":2.5384615384615383,"h_index":10,"i10_index":10},"ids":{"openalex":"https://openalex.org/A5086663453","orcid":"https://orcid.org/0000-0001-8235-9559","observed_orcids":["https://orcid.org/0000-0001-8235-9559"]},"affiliations":[{"institution":{"id":"https://openalex.org/I159385669","ror":"https://ror.org/01hjzeq58","display_name":"Chiba University","country_code":"JP","type":"education","lineage":["https://openalex.org/I159385669"]},"years":[2025,2024,2023,2022]},{"institution":{"id":"https://openalex.org/I161296585","ror":"https://ror.org/05sj3n476","display_name":"Tokyo University of Science","country_code":"JP","type":"education","lineage":["https://openalex.org/I161296585"]},"years":[2022,2020,2019]},{"institution":{"id":"https://openalex.org/I180203408","ror":"https://ror.org/03zyp6p76","display_name":"Yokohama National University","country_code":"JP","type":"education","lineage":["https://openalex.org/I180203408"]},"years":[2026,2025]},{"institution":{"id":"https://openalex.org/I4210086780","ror":"https://ror.org/00097mb19","display_name":"Japan Science and Technology Agency","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]},"years":[2016,2015]},{"institution":{"id":"https://openalex.org/I74801974","ror":"https://ror.org/057zh3y96","display_name":"The University of Tokyo","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},"years":[2020,2019,2018,2017,2016,2015]}],"last_known_institutions":[{"id":"https://openalex.org/I180203408","ror":"https://ror.org/03zyp6p76","display_name":"Yokohama National University","country_code":"JP","type":"education","lineage":["https://openalex.org/I180203408"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":42,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":33,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":17,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10275","display_name":"2D Materials and Applications","count":11,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":0.0001352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":0.0001044,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":8.32e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":6.39e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":6.04e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8977549076080322},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6865699291229248},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.5317548513412476},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3569445013999939},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.19114774465560913}],"counts_by_year":[{"year":2015,"works_count":4,"oa_works_count":2,"cited_by_count":0},{"year":2016,"works_count":4,"oa_works_count":1,"cited_by_count":8},{"year":2017,"works_count":6,"oa_works_count":1,"cited_by_count":19},{"year":2018,"works_count":8,"oa_works_count":2,"cited_by_count":19},{"year":2019,"works_count":6,"oa_works_count":2,"cited_by_count":24},{"year":2020,"works_count":6,"oa_works_count":0,"cited_by_count":21},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":53},{"year":2022,"works_count":5,"oa_works_count":3,"cited_by_count":26},{"year":2023,"works_count":3,"oa_works_count":1,"cited_by_count":29},{"year":2024,"works_count":3,"oa_works_count":0,"cited_by_count":28},{"year":2025,"works_count":7,"oa_works_count":1,"cited_by_count":42},{"year":2026,"works_count":3,"oa_works_count":2,"cited_by_count":27}],"display_name_alternatives":["KE, MENGNAN","M. Ke","Mengnan Ke","Mengnang Ke"],"block_key":"m ke","works_api_url":"https://api.openalex.org/works?filter=author.id:A5086663453","updated_date":"2026-11-03T12:34:24","created_date":"2016-06-24T00:00:00"}