{"id":"https://openalex.org/A5086334283","orcid":"https://orcid.org/0000-0002-7112-9667","observed_orcids":["https://orcid.org/0000-0002-7112-9667"],"display_name":"Dmitriy P. Makhnovskiy","raw_author_names":["D P Makhnovskiy","D. Makhnovskiy","D. P. Makhnovskii","D. P. Makhnovskiy","D. P. Makhnovsky","D.P Makhnovskiy","D.P. Mahnovskiy","D.P. Makhnovskiy","Dmitriy Makhnovskiy","Dmitriy P. Makhnovskiy","Dmitry P. Makhnovskiy","Makhnovskiy, D.","Makhnovskiy, D. P.","Makhnovskiy, Dmitriy"],"full_name":"Dmitriy P. Makhnovskiy","works_count":61,"cited_by_count":1572,"summary_stats":{"2yr_mean_citedness":2.0,"h_index":21,"i10_index":31},"ids":{"openalex":"https://openalex.org/A5086334283","orcid":"https://orcid.org/0000-0002-7112-9667","observed_orcids":["https://orcid.org/0000-0002-7112-9667"]},"affiliations":[{"institution":{"id":"https://openalex.org/I12003341","ror":"https://ror.org/019vsm959","display_name":"National University of Science and Technology","country_code":"RU","type":"education","lineage":["https://openalex.org/I12003341"]},"years":[2017]},{"institution":{"id":"https://openalex.org/I1313323035","ror":"https://ror.org/05qrfxd25","display_name":"Russian Academy of Sciences","country_code":"RU","type":"government","lineage":["https://openalex.org/I1313323035"]},"years":[2000,1999,1998]},{"institution":{"id":"https://openalex.org/I4210096404","ror":"https://ror.org/00t7t9a43","display_name":"Institute for Design Problems in Microelectronics","country_code":"RU","type":"facility","lineage":["https://openalex.org/I4210096404"]},"years":[2017]},{"institution":{"id":"https://openalex.org/I4210113031","ror":"https://ror.org/01yh3cc69","display_name":"Sensing Strategies Incorporation (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113031"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I4210160849","ror":"https://ror.org/05psg6c12","display_name":"Sensata Technologies (Netherlands)","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210160849"]},"years":[2024]},{"institution":{"id":"https://openalex.org/I76130692","ror":"https://ror.org/00a2xv884","display_name":"Zhejiang University","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]},"years":[2024,2019]},{"institution":{"id":"https://openalex.org/I897542642","ror":"https://ror.org/008n7pv89","display_name":"University of Plymouth","country_code":"GB","type":"education","lineage":["https://openalex.org/I897542642"]},"years":[2016,2015,2014,2010,2009,2008,2006,2005,2004,2003,2002,2001,2000]}],"last_known_institutions":[{"id":"https://openalex.org/I4210113031","ror":"https://ror.org/01yh3cc69","display_name":"Sensing Strategies Incorporation (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210113031"]},{"id":"https://openalex.org/I4210160849","ror":"https://ror.org/05psg6c12","display_name":"Sensata Technologies (Netherlands)","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210160849"]},{"id":"https://openalex.org/I76130692","ror":"https://ror.org/00a2xv884","display_name":"Zhejiang University","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"topics":[{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","count":49,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","count":41,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","count":26,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","count":14,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10245","display_name":"Metamaterials and Metasurfaces Applications","count":11,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","value":0.0003823,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","value":0.0001731,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","value":0.0001102,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","value":8.2e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","value":6.8e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9218341112136841},{"id":"26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","score":0.8378451466560364},{"id":"115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","score":0.6236486434936523},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5368201732635498},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.10712036490440369}],"counts_by_year":[{"year":1998,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2000,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":5,"oa_works_count":3,"cited_by_count":0},{"year":2002,"works_count":5,"oa_works_count":3,"cited_by_count":0},{"year":2003,"works_count":4,"oa_works_count":3,"cited_by_count":0},{"year":2004,"works_count":11,"oa_works_count":6,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2009,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":65},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":52},{"year":2014,"works_count":3,"oa_works_count":0,"cited_by_count":81},{"year":2015,"works_count":4,"oa_works_count":1,"cited_by_count":72},{"year":2016,"works_count":1,"oa_works_count":1,"cited_by_count":51},{"year":2017,"works_count":3,"oa_works_count":1,"cited_by_count":85},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":45},{"year":2019,"works_count":2,"oa_works_count":2,"cited_by_count":71},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":81},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":82},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":38},{"year":2023,"works_count":2,"oa_works_count":2,"cited_by_count":35},{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":49},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":33},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":41}],"display_name_alternatives":["D P Makhnovskiy","D. Makhnovskiy","D. P. Makhnovskii","D. P. Makhnovskiy","D. P. Makhnovsky","D.P Makhnovskiy","D.P. Mahnovskiy","D.P. Makhnovskiy","Dmitriy Makhnovskiy","Dmitriy P. Makhnovskiy","Dmitry P. Makhnovskiy","Makhnovskiy, D.","Makhnovskiy, D. P.","Makhnovskiy, Dmitriy"],"block_key":"d makhnovskiy","works_api_url":"https://api.openalex.org/works?filter=author.id:A5086334283","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5086334283","updated_date":"2026-11-11T13:02:13","created_date":"2016-06-24T00:00:00"}