{"id":"https://openalex.org/A5085377366","orcid":"https://orcid.org/0009-0007-7933-9275","observed_orcids":["https://orcid.org/0009-0007-7933-9275"],"display_name":"Michele Muschitiello","raw_author_names":["M Muschitiello","M. MUSCHITIELLO","M. Muschitiello","Michele Muschitiello"],"full_name":"Michele Muschitiello","works_count":58,"cited_by_count":670,"summary_stats":{"2yr_mean_citedness":4.0,"h_index":14,"i10_index":22},"ids":{"openalex":"https://openalex.org/A5085377366","orcid":"https://orcid.org/0009-0007-7933-9275","observed_orcids":["https://orcid.org/0009-0007-7933-9275"]},"affiliations":[{"institution":{"id":"https://openalex.org/I2801994115","ror":"https://ror.org/03wd9za21","display_name":"European Space Agency","country_code":"FR","type":"nonprofit","lineage":["https://openalex.org/I2801994115"]},"years":[2024,2023,2022,2019,2018,2017,2016,2015,2014,2013,2012,2011]},{"institution":{"id":"https://openalex.org/I44377176","ror":"https://ror.org/03h3jqn23","display_name":"European Space Research and Technology Centre","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]},"years":[2024,2023,2022,2019,2018,2017,2016,2015,2014,2013,2012,2011]},{"institution":{"id":"https://openalex.org/I68618741","ror":"https://ror.org/03c44v465","display_name":"Polytechnic University of Bari","country_code":"IT","type":"education","lineage":["https://openalex.org/I68618741"]},"years":[1993]}],"last_known_institutions":[{"id":"https://openalex.org/I2801994115","ror":"https://ror.org/03wd9za21","display_name":"European Space Agency","country_code":"FR","type":"nonprofit","lineage":["https://openalex.org/I2801994115"]},{"id":"https://openalex.org/I44377176","ror":"https://ror.org/03h3jqn23","display_name":"European Space Research and Technology Centre","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]}],"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":39,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","count":36,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":23,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":14,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","value":0.0005951,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":0.0003374,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0003257,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":9.64e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","value":7.22e-05,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8412914276123047},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7152373790740967},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7095820903778076},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.567300021648407},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4281645119190216}],"counts_by_year":[{"year":1988,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1989,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":1990,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1991,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":3,"oa_works_count":0,"cited_by_count":9},{"year":2013,"works_count":5,"oa_works_count":0,"cited_by_count":20},{"year":2014,"works_count":4,"oa_works_count":1,"cited_by_count":26},{"year":2015,"works_count":7,"oa_works_count":3,"cited_by_count":19},{"year":2016,"works_count":2,"oa_works_count":2,"cited_by_count":32},{"year":2017,"works_count":3,"oa_works_count":2,"cited_by_count":36},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":51},{"year":2019,"works_count":5,"oa_works_count":0,"cited_by_count":53},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":44},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":51},{"year":2022,"works_count":4,"oa_works_count":1,"cited_by_count":48},{"year":2023,"works_count":2,"oa_works_count":0,"cited_by_count":51},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":59},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":64},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":46}],"display_name_alternatives":["M Muschitiello","M. MUSCHITIELLO","M. Muschitiello","Michele Muschitiello"],"block_key":"m muschitiello","works_api_url":"https://api.openalex.org/works?filter=author.id:A5085377366","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}