{"id":"https://openalex.org/A5083808660","orcid":null,"observed_orcids":[],"display_name":"Hans Manhaeve","raw_author_names":["H. Manhaeve","H.A.R. Manhaeve","Hans Manhaeve","Manhaeve, Hans"],"full_name":"Hans Manhaeve","works_count":39,"cited_by_count":214,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":8,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5083808660","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I150145467","ror":"https://ror.org/00fy5v859","display_name":"University of Applied Sciences West Flanders","country_code":"BE","type":"education","lineage":["https://openalex.org/I150145467"]},"years":[1991]},{"institution":{"id":"https://openalex.org/I191240316","ror":"https://ror.org/04nkhwh30","display_name":"University of Hull","country_code":"GB","type":"education","lineage":["https://openalex.org/I191240316"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I2800805412","ror":"https://ror.org/0113zvv22","display_name":"Catholic University College of Bruges\u2013Ostend","country_code":"BE","type":"education","lineage":["https://openalex.org/I2800805412","https://openalex.org/I4210134168"]},"years":[2003,2002,2000,1999,1998,1997,1996]},{"institution":{"id":"https://openalex.org/I4210100499","ror":"https://ror.org/00hn6mk14","display_name":"Ridgetop Group (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210100499"]},"years":[2018,2014,2013]},{"institution":{"id":"https://openalex.org/I60587646","ror":"https://ror.org/03613d656","display_name":"Brno University of Technology","country_code":"CZ","type":"education","lineage":["https://openalex.org/I60587646"]},"years":[1999,1996]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":32,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":27,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","count":11,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","count":6,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0003711,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":0.0003191,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":9.26e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":4.97e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","value":4.02e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","score":0.7034493684768677},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6994268298149109},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.6253565549850464},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.622533917427063},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.5244067907333374}],"counts_by_year":[{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":9,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2013,"works_count":3,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":1,"oa_works_count":1,"cited_by_count":6},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":4},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":7},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":8},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["H. Manhaeve","H.A.R. Manhaeve","Hans Manhaeve","Manhaeve, Hans"],"block_key":"h manhaeve","works_api_url":"https://api.openalex.org/works?filter=author.id:A5083808660","updated_date":"2026-11-03T12:34:24","created_date":"2016-06-24T00:00:00"}