{"id":"https://openalex.org/A5083723091","orcid":null,"observed_orcids":[],"display_name":"Zhao-Ze Li","raw_author_names":["Zhao-Ze Li"],"full_name":"Zhao-Ze Li","works_count":1,"cited_by_count":4,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5083723091","orcid":null,"observed_orcids":[]},"affiliations":[],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","count":1,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":9.3e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.6e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","value":4.2e-06,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"2779751349","wikidata":"https://www.wikidata.org/wiki/Q1474480","display_name":"Scanner","score":0.9511063098907471},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5649356842041016},{"id":"116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","score":0.48651450872421265},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.4015331268310547},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.38486766815185547}],"counts_by_year":[{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Zhao-Ze Li"],"block_key":"z li","works_api_url":"https://api.openalex.org/works?filter=author.id:A5083723091","updated_date":"2026-10-27T12:30:23","created_date":"2017-03-23T00:00:00"}