{"id":"https://openalex.org/A5083381399","orcid":"https://orcid.org/0000-0002-4058-7649","observed_orcids":["https://orcid.org/0000-0002-4058-7649"],"display_name":"Ryo Tanaka","raw_author_names":["R Tanaka","R. Tanaka","Ryo Tanaka","Tanaka, R.","Tanaka, Ryo"],"full_name":"Tanaka, Ryo","works_count":195,"cited_by_count":1002,"summary_stats":{"2yr_mean_citedness":4.909090909090909,"h_index":16,"i10_index":24},"ids":{"openalex":"https://openalex.org/A5083381399","orcid":"https://orcid.org/0000-0002-4058-7649","observed_orcids":["https://orcid.org/0000-0002-4058-7649"]},"affiliations":[{"institution":{"id":"https://openalex.org/I10091056","ror":"https://ror.org/02hwp6a56","display_name":"Kanazawa University","country_code":"JP","type":"education","lineage":["https://openalex.org/I10091056"]},"years":[2011]},{"institution":{"id":"https://openalex.org/I103390050","ror":"https://ror.org/012tqgb57","display_name":"Ryukoku University","country_code":"JP","type":"education","lineage":["https://openalex.org/I103390050"]},"years":[2023,2019,2018,2017]},{"institution":{"id":"https://openalex.org/I105296287","ror":"https://ror.org/057xtrt18","display_name":"Kurume University","country_code":"JP","type":"education","lineage":["https://openalex.org/I105296287"]},"years":[2017]},{"institution":{"id":"https://openalex.org/I1320697193","ror":"https://ror.org/05gg0gh87","display_name":"Canon (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I1320697193"]},"years":[2021]},{"institution":{"id":"https://openalex.org/I135598925","ror":"https://ror.org/00p4k0j84","display_name":"Kyushu University","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]},"years":[2018,2017,2015,2006]},{"institution":{"id":"https://openalex.org/I146399215","ror":"https://ror.org/02956yf07","display_name":"University of Tsukuba","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I154570441","ror":"https://ror.org/02t274463","display_name":"University of California, Santa Barbara","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]},"years":[2017]},{"institution":{"id":"https://openalex.org/I16656306","ror":"https://ror.org/02rqvrp93","display_name":"Meiji University","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]},"years":[2017,2016,2015,2014,2013]},{"institution":{"id":"https://openalex.org/I177136067","ror":"https://ror.org/04f4wg107","display_name":"Saga University","country_code":"JP","type":"education","lineage":["https://openalex.org/I177136067"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I180941496","ror":"https://ror.org/0151bmh98","display_name":"University of Hyogo","country_code":"JP","type":"education","lineage":["https://openalex.org/I180941496"]},"years":[2017]},{"institution":{"id":"https://openalex.org/I197274945","ror":"https://ror.org/055yf1005","display_name":"Nagoya Institute of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I197274945"]},"years":[2008,2007,2006]},{"institution":{"id":"https://openalex.org/I205401836","ror":"https://ror.org/026v1ze26","display_name":"National Institute for Materials Science","country_code":"JP","type":"facility","lineage":["https://openalex.org/I205401836"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I206011266","ror":"https://ror.org/02qf2tx24","display_name":"Kwansei Gakuin University","country_code":"JP","type":"education","lineage":["https://openalex.org/I206011266"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I2251713219","ror":"https://ror.org/00berct97","display_name":"NTT (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]},"years":[2010,2009,2008]},{"institution":{"id":"https://openalex.org/I2799635668","ror":"https://ror.org/056701b75","display_name":"Fuji Electric (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2799635668"]},"years":[2025,2024,2023,2022,2021,2020,2019,2018,2017,2016]},{"institution":{"id":"https://openalex.org/I4210086780","ror":"https://ror.org/00097mb19","display_name":"Japan Science and Technology Agency","country_code":"JP","type":"government","lineage":["https://openalex.org/I1319490839","https://openalex.org/I4210086780"]},"years":[2010,2009]},{"institution":{"id":"https://openalex.org/I4210091332","ror":"https://ror.org/00fb7yx07","display_name":"Institute of High Pressure Physics","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210091332","https://openalex.org/I99542240"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I4210092329","ror":"https://ror.org/00e1wd906","display_name":"Institute of Electronics, Information and Communication Engineers","country_code":"JP","type":"nonprofit","lineage":["https://openalex.org/I4210092329"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I4210099780","ror":"https://ror.org/00xefvv79","display_name":"National Institute of Technology, Kurume College","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210099780","https://openalex.org/I4210120810"]},"years":[2023,2022,2021,2020,2019,2018,2017]},{"institution":{"id":"https://openalex.org/I4210106587","ror":"https://ror.org/01bvqg661","display_name":"Nikon (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210106587"]},"years":[2010,2009,2004]},{"institution":{"id":"https://openalex.org/I4210116533","ror":"https://ror.org/01tqja591","display_name":"Morinaga (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210116533"]},"years":[2023]},{"institution":{"id":"https://openalex.org/I4210125446","ror":"https://ror.org/02xnwme44","display_name":"Ulvac (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125446"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I4405275046","ror":"https://ror.org/02vm14z65","display_name":"NTT Facilities, Inc. (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405275046"]},"years":[2010,2009,2008]},{"institution":{"id":"https://openalex.org/I60134161","ror":"https://ror.org/04chrp450","display_name":"Nagoya University","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I69740276","ror":"https://ror.org/00ws30h19","display_name":"Tokyo Metropolitan University","country_code":"JP","type":"education","lineage":["https://openalex.org/I69740276"]},"years":[2009]},{"institution":{"id":"https://openalex.org/I74801974","ror":"https://ror.org/057zh3y96","display_name":"The University of Tokyo","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},"years":[2019,2010,2009]},{"institution":{"id":"https://openalex.org/I96036126","ror":"https://ror.org/02cgss904","display_name":"Kumamoto University","country_code":"JP","type":"education","lineage":["https://openalex.org/I96036126"]},"years":[2023]},{"institution":{"id":"https://openalex.org/I99542240","ror":"https://ror.org/01dr6c206","display_name":"Polish Academy of Sciences","country_code":"PL","type":"government","lineage":["https://openalex.org/I99542240"]},"years":[2022]}],"last_known_institutions":[{"id":"https://openalex.org/I2799635668","ror":"https://ror.org/056701b75","display_name":"Fuji Electric (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2799635668"]}],"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","count":59,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":55,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11081","display_name":"Advanced Control Systems Design","count":32,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10464","display_name":"Crystal structures of chemical compounds","count":29,"subfield":{"id":"https://openalex.org/subfields/1604","display_name":"Inorganic Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10798","display_name":"Crystallography and molecular interactions","count":29,"subfield":{"id":"https://openalex.org/subfields/1606","display_name":"Physical and Theoretical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","value":0.000243,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","value":0.0002421,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11766","display_name":"Iron-based superconductors research","value":0.0001734,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","value":0.0001732,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":0.0001249,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9304822087287903},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7578207850456238},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7501100301742554},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.611411452293396},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.51534503698349}],"counts_by_year":[{"year":2000,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2004,"works_count":4,"oa_works_count":2,"cited_by_count":0},{"year":2005,"works_count":3,"oa_works_count":3,"cited_by_count":0},{"year":2006,"works_count":7,"oa_works_count":3,"cited_by_count":32},{"year":2007,"works_count":6,"oa_works_count":5,"cited_by_count":17},{"year":2008,"works_count":7,"oa_works_count":4,"cited_by_count":34},{"year":2009,"works_count":13,"oa_works_count":4,"cited_by_count":37},{"year":2010,"works_count":11,"oa_works_count":4,"cited_by_count":136},{"year":2011,"works_count":6,"oa_works_count":4,"cited_by_count":5},{"year":2012,"works_count":4,"oa_works_count":4,"cited_by_count":0},{"year":2013,"works_count":14,"oa_works_count":5,"cited_by_count":39},{"year":2014,"works_count":8,"oa_works_count":0,"cited_by_count":20},{"year":2015,"works_count":8,"oa_works_count":3,"cited_by_count":17},{"year":2016,"works_count":10,"oa_works_count":2,"cited_by_count":19},{"year":2017,"works_count":13,"oa_works_count":1,"cited_by_count":144},{"year":2018,"works_count":18,"oa_works_count":0,"cited_by_count":32},{"year":2019,"works_count":16,"oa_works_count":5,"cited_by_count":248},{"year":2020,"works_count":9,"oa_works_count":2,"cited_by_count":56},{"year":2021,"works_count":11,"oa_works_count":2,"cited_by_count":67},{"year":2022,"works_count":3,"oa_works_count":1,"cited_by_count":23},{"year":2023,"works_count":10,"oa_works_count":2,"cited_by_count":22},{"year":2024,"works_count":5,"oa_works_count":4,"cited_by_count":47},{"year":2025,"works_count":6,"oa_works_count":4,"cited_by_count":7}],"display_name_alternatives":["R Tanaka","R. Tanaka","Ryo Tanaka","Tanaka, R.","Tanaka, Ryo"],"block_key":"r tanaka","works_api_url":"https://api.openalex.org/works?filter=author.id:A5083381399","updated_date":"2026-10-18T12:41:17","created_date":"2016-06-24T00:00:00"}