{"id":"https://openalex.org/A5083274418","orcid":"https://orcid.org/0000-0002-3929-2907","observed_orcids":["https://orcid.org/0000-0002-3929-2907"],"display_name":"Ramya Cuduvally","raw_author_names":["Cuduvally, Ramya","Ramya Cuduvally","Ramya M. Cuduvally"],"full_name":"Ramya M. Cuduvally","works_count":20,"cited_by_count":229,"summary_stats":{"2yr_mean_citedness":2.4285714285714284,"h_index":8,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5083274418","orcid":"https://orcid.org/0000-0002-3929-2907","observed_orcids":["https://orcid.org/0000-0002-3929-2907"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1327163397","ror":"https://ror.org/01q1z8k08","display_name":"State University of New York","country_code":"US","type":"education","lineage":["https://openalex.org/I1327163397"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I392282","ror":"https://ror.org/012zs8222","display_name":"University at Albany, State University of New York","country_code":"US","type":"education","lineage":["https://openalex.org/I392282"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I4210114974","ror":"https://ror.org/02kcbn207","display_name":"IMEC","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},"years":[2022,2021,2019,2018]},{"institution":{"id":"https://openalex.org/I4387152700","ror":"https://ror.org/02w3v2f07","display_name":"Canadian Centre for Electron Microscopy","country_code":"CA","type":"facility","lineage":["https://openalex.org/I4387152700"]},"years":[2026,2025,2024,2022]},{"institution":{"id":"https://openalex.org/I59270414","ror":"https://ror.org/04dese585","display_name":"Indian Institute of Science Bangalore","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]},"years":[2015]},{"institution":{"id":"https://openalex.org/I90965887","ror":"https://ror.org/000fxgx19","display_name":"SUNY Polytechnic Institute","country_code":"US","type":"education","lineage":["https://openalex.org/I90965887"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I98251732","ror":"https://ror.org/02fa3aq29","display_name":"McMaster University","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]},"years":[2026,2025,2024,2023,2022]},{"institution":{"id":"https://openalex.org/I99464096","ror":"https://ror.org/05f950310","display_name":"KU Leuven","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},"years":[2022,2021,2019,2018]}],"last_known_institutions":[{"id":"https://openalex.org/I4387152700","ror":"https://ror.org/02w3v2f07","display_name":"Canadian Centre for Electron Microscopy","country_code":"CA","type":"facility","lineage":["https://openalex.org/I4387152700"]},{"id":"https://openalex.org/I98251732","ror":"https://ror.org/02fa3aq29","display_name":"McMaster University","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"topics":[{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","count":14,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","count":8,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":7,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","count":5,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":0.000182,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":4.24e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","value":2.84e-05,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","value":2.68e-05,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7712613940238953},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5820983052253723},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.5753403306007385},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.5245085954666138},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.41797682642936707}],"counts_by_year":[{"year":2014,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":11},{"year":2019,"works_count":4,"oa_works_count":3,"cited_by_count":15},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":21},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":36},{"year":2022,"works_count":2,"oa_works_count":2,"cited_by_count":19},{"year":2023,"works_count":2,"oa_works_count":0,"cited_by_count":20},{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":31},{"year":2025,"works_count":3,"oa_works_count":3,"cited_by_count":35},{"year":2026,"works_count":2,"oa_works_count":1,"cited_by_count":24}],"display_name_alternatives":["Cuduvally, Ramya","Ramya Cuduvally","Ramya M. Cuduvally"],"block_key":"r cuduvally","works_api_url":"https://api.openalex.org/works?filter=author.id:A5083274418","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5083274418","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}