{"id":"https://openalex.org/A5083129538","orcid":null,"observed_orcids":[],"display_name":"P.-F. Inderm\u00fchle","raw_author_names":["Inderm\u00c3\u00bchle, P.-F.","Inderm\u00fchle, Pierre-Fran\u00e7ois","P F Indermuhle","P. F. Indermuhle","P. F. Inderm\u00fchle","P.-F Indermuhle","P.-F Inderm\u00fchle","P.-F. Indermuehle","P.-F. Indermuhle","P.-F. Inderm\u00fchle"],"full_name":"Inderm\u00fchle, Pierre-Fran\u00e7ois","works_count":23,"cited_by_count":312,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":10,"i10_index":10},"ids":{"openalex":"https://openalex.org/A5083129538","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I57825437","ror":"https://ror.org/00vasag41","display_name":"University of Neuch\u00e2tel","country_code":"CH","type":"education","lineage":["https://openalex.org/I57825437"]},"years":[2005,2002,2001,2000,1999,1998,1997,1996,1995,1994,1993]}],"last_known_institutions":[{"id":"https://openalex.org/I57825437","ror":"https://ror.org/00vasag41","display_name":"University of Neuch\u00e2tel","country_code":"CH","type":"education","lineage":["https://openalex.org/I57825437"]}],"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","count":18,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","count":18,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","count":12,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10412","display_name":"Microfluidic and Capillary Electrophoresis Applications","count":4,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10478","display_name":"Diamond and Carbon-based Materials Research","count":2,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11525","display_name":"Piezoelectric Actuators and Control","value":0.0001591,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","value":0.000109,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","value":8.12e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12776","display_name":"Electrohydrodynamics and Fluid Dynamics","value":2.95e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","value":2.13e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","score":0.8023149967193604},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7746671438217163},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.7381480932235718},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5373742580413818},{"id":"142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","score":0.0}],"counts_by_year":[{"year":1993,"works_count":3,"oa_works_count":3,"cited_by_count":0},{"year":1994,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1995,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1997,"works_count":4,"oa_works_count":4,"cited_by_count":0},{"year":1998,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1999,"works_count":3,"oa_works_count":3,"cited_by_count":0},{"year":2000,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2002,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":22},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Inderm\u00c3\u00bchle, P.-F.","Inderm\u00fchle, Pierre-Fran\u00e7ois","P F Indermuhle","P. F. Indermuhle","P. F. Inderm\u00fchle","P.-F Indermuhle","P.-F Inderm\u00fchle","P.-F. Indermuehle","P.-F. Indermuhle","P.-F. Inderm\u00fchle"],"block_key":"p indermuhle","works_api_url":"https://api.openalex.org/works?filter=author.id:A5083129538","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}