{"id":"https://openalex.org/A5082672005","orcid":"https://orcid.org/0000-0002-0682-396X","observed_orcids":["https://orcid.org/0000-0002-0682-396X"],"display_name":"Nastaran Nemati","raw_author_names":["Nastaran Nemati","Nemati, Nastaran"],"full_name":"Nastaran Nemati","works_count":14,"cited_by_count":41,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":4,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5082672005","orcid":"https://orcid.org/0000-0002-0682-396X","observed_orcids":["https://orcid.org/0000-0002-0682-396X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I143302722","ror":"https://ror.org/02k3smh20","display_name":"University of Kentucky","country_code":"US","type":"education","lineage":["https://openalex.org/I143302722"]},"years":[2026]},{"institution":{"id":"https://openalex.org/I23946033","ror":"https://ror.org/05vf56z40","display_name":"University of Tehran","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]},"years":[2011,2010,2009]},{"institution":{"id":"https://openalex.org/I31746571","ror":"https://ror.org/03r8z3t63","display_name":"UNSW Sydney","country_code":"AU","type":"education","lineage":["https://openalex.org/I31746571"]},"years":[2016]},{"institution":{"id":"https://openalex.org/I4394709116","ror":"https://ror.org/0125wpx05","display_name":"UNSW Canberra","country_code":"AU","type":"education","lineage":["https://openalex.org/I31746571","https://openalex.org/I4394709116"]},"years":[2016,2014]}],"last_known_institutions":[{"id":"https://openalex.org/I143302722","ror":"https://ror.org/02k3smh20","display_name":"University of Kentucky","country_code":"US","type":"education","lineage":["https://openalex.org/I143302722"]}],"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":12,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","count":5,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10142","display_name":"Formal Methods in Verification","count":2,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":0.0001252,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":4.33e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":3.21e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","value":2.27e-05,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","value":2.09e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","score":0.7766000032424927},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7656754851341248},{"id":"149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","score":0.746938943862915},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.5411192178726196},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3324846029281616}],"counts_by_year":[{"year":2009,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":4,"oa_works_count":1,"cited_by_count":8},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":0}],"display_name_alternatives":["Nastaran Nemati","Nemati, Nastaran"],"block_key":"n nemati","works_api_url":"https://api.openalex.org/works?filter=author.id:A5082672005","awards_count":0,"updated_date":"2026-11-09T14:06:01","created_date":"2016-06-24T00:00:00"}