{"id":"https://openalex.org/A5082634082","orcid":null,"observed_orcids":[],"display_name":"Carl F. Diegert","raw_author_names":["C Diegert","C. Diegert","Carl Diegert","Carl F. DIEGERT","Carl F. Diegert","Diegert, C.","Diegert, Carl F."],"full_name":"Diegert, Carl F.","works_count":30,"cited_by_count":64,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5082634082","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I122411786","ror":"https://ror.org/05dxps055","display_name":"California Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]},"years":[1975]},{"institution":{"id":"https://openalex.org/I1334627681","ror":"https://ror.org/027k65916","display_name":"Jet Propulsion Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I122411786","https://openalex.org/I1334627681","https://openalex.org/I4210124779"]},"years":[1975]},{"institution":{"id":"https://openalex.org/I192454743","ror":"https://ror.org/058m7ey48","display_name":"Sandia National Laboratories California","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I192454743","https://openalex.org/I198811213","https://openalex.org/I4210104735"]},"years":[1998,1997,1996,1993]},{"institution":{"id":"https://openalex.org/I4210104735","ror":"https://ror.org/01apwpt12","display_name":"Sandia National Laboratories","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]},"years":[2010,1998,1997,1996,1995,1993,1992,1990,1988]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","count":5,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","count":4,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","value":6.89e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13282","display_name":"Automated Road and Building Extraction","value":5.36e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14509","display_name":"demographic modeling and climate adaptation","value":4.32e-05,"subfield":{"id":"https://openalex.org/subfields/3305","display_name":"Geography, Planning and Development"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","value":2.21e-05,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","value":1.76e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7985860705375671},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5945354104042053},{"id":"199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","score":0.5662834644317627},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.5318455696105957},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.23315924406051636}],"counts_by_year":[{"year":1974,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1975,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1988,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1990,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":3,"oa_works_count":3,"cited_by_count":0},{"year":1997,"works_count":4,"oa_works_count":4,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2009,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2010,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2016,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":2,"oa_works_count":2,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["C Diegert","C. Diegert","Carl Diegert","Carl F. DIEGERT","Carl F. Diegert","Diegert, C.","Diegert, Carl F."],"block_key":"c diegert","works_api_url":"https://api.openalex.org/works?filter=author.id:A5082634082","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5082634082","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}