{"id":"https://openalex.org/A5082527072","orcid":null,"observed_orcids":[],"display_name":"P. Kennis","raw_author_names":["KENNIS, Patrick","Kennis, P.","P. Kennis","Patrick Kennis"],"full_name":"Patrick Kennis","works_count":94,"cited_by_count":445,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":10,"i10_index":11},"ids":{"openalex":"https://openalex.org/A5082527072","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2006,2005,2003,2002,2000,1999,1998,1997,1995,1994,1993,1992,1991,1990,1989,1988,1987,1986,1985,1983,1982,1981,1980,1978]},{"institution":{"id":"https://openalex.org/I2279609970","ror":"https://ror.org/02kzqn938","display_name":"Universit\u00e9 de Lille","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970"]},"years":[2005,1997,1992,1988,1986,1984,1983,1982,1981,1980,1978]},{"institution":{"id":"https://openalex.org/I4210123471","ror":"https://ror.org/02q4res37","display_name":"Institut d'Electronique, de Micro\u00e9lectronique et de Nanotechnologie","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I2279609970","https://openalex.org/I4210095849","https://openalex.org/I4210116330","https://openalex.org/I4210123471","https://openalex.org/I70348806","https://openalex.org/I7454413"]},"years":[2002,2000,1999,1998,1997,1994]},{"institution":{"id":"https://openalex.org/I4387154560","ror":"https://ror.org/040hwdc70","display_name":"Universit\u00e9 Lille 1","country_code":"FR","type":"education","lineage":["https://openalex.org/I2279609970","https://openalex.org/I4387154560"]},"years":[2005,1982,1980]},{"institution":{"id":"https://openalex.org/I4405258264","ror":"https://ror.org/00crteh33","display_name":"Universit\u00e9 Rennes 1","country_code":"FR","type":"education","lineage":["https://openalex.org/I4405258264","https://openalex.org/I56067802"]},"years":[1985]},{"institution":{"id":"https://openalex.org/I56067802","ror":"https://ror.org/015m7wh34","display_name":"Universit\u00e9 de Rennes","country_code":"FR","type":"education","lineage":["https://openalex.org/I56067802"]},"years":[1985]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","count":79,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","count":46,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","count":29,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":27,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10069","display_name":"Antenna Design and Analysis","count":22,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","value":0.0002017,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","value":0.0002006,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":0.0001794,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","value":0.0001772,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","value":0.0001284,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7032161951065063},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.6656168699264526},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.664474368095398},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.663970947265625},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.44519007205963135}],"counts_by_year":[{"year":1978,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1980,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1981,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1982,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1983,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1984,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1985,"works_count":6,"oa_works_count":2,"cited_by_count":0},{"year":1986,"works_count":5,"oa_works_count":2,"cited_by_count":0},{"year":1987,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1988,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":1990,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2002,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["KENNIS, Patrick","Kennis, P.","P. Kennis","Patrick Kennis"],"block_key":"p kennis","works_api_url":"https://api.openalex.org/works?filter=author.id:A5082527072","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}