{"id":"https://openalex.org/A5082437551","orcid":null,"observed_orcids":[],"display_name":"H.C. Rieffe","raw_author_names":["H. C. Rieffe","H. Ch. Rieffe","H. Rieffe","H.C. Rieffe","Henk Rieffe","Rieffe, H.","Rieffe, H. C."],"full_name":"Rieffe, H. C.","works_count":19,"cited_by_count":307,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":6},"ids":{"openalex":"https://openalex.org/A5082437551","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I2802259095","ror":"https://ror.org/04xa4c474","display_name":"Energy Research Centre of the Netherlands","country_code":"NL","type":"facility","lineage":["https://openalex.org/I2802259095"]},"years":[2005,2003,2002,2000,1983,1978]}],"last_known_institutions":[{"id":"https://openalex.org/I2802259095","ror":"https://ror.org/04xa4c474","display_name":"Energy Research Centre of the Netherlands","country_code":"NL","type":"facility","lineage":["https://openalex.org/I2802259095"]}],"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","count":15,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","count":15,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","count":5,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10597","display_name":"Nuclear reactor physics and engineering","count":3,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","value":7.18e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","value":6.07e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","value":4.53e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","value":2.56e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":1.19e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"33574316","wikidata":"https://www.wikidata.org/wiki/Q917260","display_name":"Passivation","score":0.9904460310935974},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7929663062095642},{"id":"544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","score":0.6617655754089355},{"id":"2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","score":0.5629861354827881},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.4315757751464844}],"counts_by_year":[{"year":1978,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1981,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1983,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2003,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":4}],"display_name_alternatives":["H. C. Rieffe","H. Ch. Rieffe","H. Rieffe","H.C. Rieffe","Henk Rieffe","Rieffe, H.","Rieffe, H. C."],"block_key":"h rieffe","works_api_url":"https://api.openalex.org/works?filter=author.id:A5082437551","updated_date":"2026-10-27T12:30:23","created_date":"2016-06-24T00:00:00"}