{"id":"https://openalex.org/A5082361263","orcid":"https://orcid.org/0000-0002-5664-808X","observed_orcids":["https://orcid.org/0000-0002-5664-808X"],"display_name":"H.E. Polozhii","raw_author_names":["H. Ye. Polozhii","H.E. Polozhii","H.Ye. Polozhii","Hlib E. Polozhii","Hlib Polozhii"],"full_name":"Hlib E. Polozhii","works_count":8,"cited_by_count":12,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":2,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5082361263","orcid":"https://orcid.org/0000-0002-5664-808X","observed_orcids":["https://orcid.org/0000-0002-5664-808X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I126792128","ror":"https://ror.org/01km14z09","display_name":"Institute of Applied Physics","country_code":"UA","type":"facility","lineage":["https://openalex.org/I126792128","https://openalex.org/I149851306"]},"years":[2025,2023,2022,2021,2020]},{"institution":{"id":"https://openalex.org/I149851306","ror":"https://ror.org/00je4t102","display_name":"National Academy of Sciences of Ukraine","country_code":"UA","type":"government","lineage":["https://openalex.org/I149851306"]},"years":[2023,2022,2021]}],"last_known_institutions":[{"id":"https://openalex.org/I126792128","ror":"https://ror.org/01km14z09","display_name":"Institute of Applied Physics","country_code":"UA","type":"facility","lineage":["https://openalex.org/I126792128","https://openalex.org/I149851306"]}],"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":7,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11367","display_name":"Particle accelerators and beam dynamics","count":4,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","count":2,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10412","display_name":"Microfluidic and Capillary Electrophoresis Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":3.7e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","value":1.57e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","value":1.07e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","value":1.06e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","value":7.7e-06,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8328183889389038},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7304220795631409},{"id":"168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","score":0.6532301306724548},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.447714239358902},{"id":"185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","score":0.38821864128112793}],"counts_by_year":[{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2022,"works_count":2,"oa_works_count":1,"cited_by_count":2},{"year":2023,"works_count":3,"oa_works_count":2,"cited_by_count":5},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["H. Ye. Polozhii","H.E. Polozhii","H.Ye. Polozhii","Hlib E. Polozhii","Hlib Polozhii"],"block_key":"h polozhii","works_api_url":"https://api.openalex.org/works?filter=author.id:A5082361263","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5082361263","updated_date":"2026-11-12T13:17:38","created_date":"2021-01-18T00:00:00"}