{"id":"https://openalex.org/A5082196352","orcid":"https://orcid.org/0000-0001-6148-8079","observed_orcids":["https://orcid.org/0000-0001-6148-8079"],"display_name":"David C. Gilmer","raw_author_names":["D C Gilmer","D. C. Gilmer","D. Gilmer","D.C. Gilmer","D.\u2009C. Gilmer","David C Gilmer","David C. Gilmer","David Gilmer"],"full_name":"David C. Gilmer","works_count":145,"cited_by_count":6271,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":38,"i10_index":80},"ids":{"openalex":"https://openalex.org/A5082196352","orcid":"https://orcid.org/0000-0001-6148-8079","observed_orcids":["https://orcid.org/0000-0001-6148-8079"]},"affiliations":[{"institution":{"id":"https://openalex.org/I130238516","ror":"https://ror.org/017zqws13","display_name":"University of Minnesota","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]},"years":[2002,1999,1998,1997,1996]},{"institution":{"id":"https://openalex.org/I1333370159","ror":"https://ror.org/01hafxd32","display_name":"Motorola (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]},"years":[2005,2004,2003,2002,2001,2000,1999]},{"institution":{"id":"https://openalex.org/I133731052","ror":"https://ror.org/040af2s02","display_name":"University of Helsinki","country_code":"FI","type":"education","lineage":["https://openalex.org/I133731052"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I146655781","ror":"https://ror.org/04xs57h96","display_name":"University of Liverpool","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I20231570","ror":"https://ror.org/02v51f717","display_name":"Peking University","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},"years":[2012]},{"institution":{"id":"https://openalex.org/I2799611596","ror":"https://ror.org/00ppzen87","display_name":"Empire State Development","country_code":"US","type":"government","lineage":["https://openalex.org/I2799611596"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I2801444776","ror":"https://ror.org/01my9vf82","display_name":"New York State Library","country_code":"US","type":"government","lineage":["https://openalex.org/I2801444776"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I32971472","ror":"https://ror.org/03v76x132","display_name":"Yale University","country_code":"US","type":"education","lineage":["https://openalex.org/I32971472"]},"years":[2005]},{"institution":{"id":"https://openalex.org/I4210115145","ror":"https://ror.org/01hy4qx27","display_name":"University of Minnesota, Duluth","country_code":"US","type":"education","lineage":["https://openalex.org/I4210115145"]},"years":[1998]},{"institution":{"id":"https://openalex.org/I4210126915","ror":"https://ror.org/02p65v128","display_name":"Semtech (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210126915"]},"years":[2010]},{"institution":{"id":"https://openalex.org/I4210156936","ror":"https://ror.org/05gjbbg60","display_name":"IBM Research - Austin","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]},"years":[2008]},{"institution":{"id":"https://openalex.org/I4387153248","ror":"https://ror.org/0033v8v27","display_name":"Freescale Semiconductor (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4387153248"]},"years":[2006]},{"institution":{"id":"https://openalex.org/I74760111","ror":"https://ror.org/03vsmv677","display_name":"Texas Instruments (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},"years":[1999]},{"institution":{"id":"https://openalex.org/I86519309","ror":"https://ror.org/00hj54h04","display_name":"The University of Texas at Austin","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]},"years":[2003]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":117,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","count":93,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":51,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","count":50,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":43,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":0.0010131,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":0.0005036,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","value":0.0003064,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":0.0002424,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":0.0001593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.926266074180603},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6924312114715576},{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.6331745982170105},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.5038337111473083},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.42546141147613525}],"counts_by_year":[{"year":1996,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":10,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":11,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":10,"oa_works_count":1,"cited_by_count":0},{"year":2007,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":8,"oa_works_count":2,"cited_by_count":0},{"year":2009,"works_count":8,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":7,"oa_works_count":3,"cited_by_count":0},{"year":2011,"works_count":5,"oa_works_count":2,"cited_by_count":0},{"year":2012,"works_count":14,"oa_works_count":2,"cited_by_count":251},{"year":2013,"works_count":17,"oa_works_count":6,"cited_by_count":328},{"year":2014,"works_count":11,"oa_works_count":2,"cited_by_count":389},{"year":2015,"works_count":5,"oa_works_count":3,"cited_by_count":356},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":371},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":357},{"year":2018,"works_count":2,"oa_works_count":1,"cited_by_count":325},{"year":2019,"works_count":2,"oa_works_count":0,"cited_by_count":338},{"year":2020,"works_count":2,"oa_works_count":0,"cited_by_count":299},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":280},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":264},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":237},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":167},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":160},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":111}],"display_name_alternatives":["D C Gilmer","D. C. Gilmer","D. Gilmer","D.C. Gilmer","D.\u2009C. Gilmer","David C Gilmer","David C. Gilmer","David Gilmer"],"block_key":"d gilmer","works_api_url":"https://api.openalex.org/works?filter=author.id:A5082196352","awards_count":0,"updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}