{"id":"https://openalex.org/A5081798280","orcid":"https://orcid.org/0000-0002-0477-3508","observed_orcids":["https://orcid.org/0000-0002-0477-3508","https://orcid.org/0000-0002-4775-7241"],"display_name":"Zhouqiang Zhang","raw_author_names":["ZHANG Zhouqiang","Zhouqiang Zhang"],"full_name":"Zhouqiang Zhang","works_count":23,"cited_by_count":99,"summary_stats":{"2yr_mean_citedness":1.8333333333333333,"h_index":5,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5081798280","orcid":"https://orcid.org/0000-0002-0477-3508","observed_orcids":["https://orcid.org/0000-0002-0477-3508","https://orcid.org/0000-0002-4775-7241"]},"affiliations":[{"institution":{"id":"https://openalex.org/I27599042","ror":"https://ror.org/03442p831","display_name":"Xi'an Polytechnic University","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]},"years":[2026,2025,2024,2023,2021,2020,2019]},{"institution":{"id":"https://openalex.org/I87445476","ror":"https://ror.org/017zhmm22","display_name":"Xi'an Jiaotong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]},"years":[2016,2015,2013]}],"last_known_institutions":[{"id":"https://openalex.org/I27599042","ror":"https://ror.org/03442p831","display_name":"Xi'an Polytechnic University","country_code":"CN","type":"education","lineage":["https://openalex.org/I27599042"]}],"topics":[{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","count":4,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":4,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11737","display_name":"Advanced Materials and Mechanics","count":3,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","value":3.16e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","value":2.13e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":1.85e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","value":1.76e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11737","display_name":"Advanced Materials and Mechanics","value":1.59e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8614000082015991},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8411386013031006},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.8144145011901855},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.44446492195129395},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.436376690864563}],"counts_by_year":[{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2015,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2016,"works_count":3,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2019,"works_count":2,"oa_works_count":1,"cited_by_count":3},{"year":2020,"works_count":3,"oa_works_count":0,"cited_by_count":3},{"year":2021,"works_count":4,"oa_works_count":2,"cited_by_count":4},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":27},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":17},{"year":2025,"works_count":4,"oa_works_count":1,"cited_by_count":8},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":21}],"display_name_alternatives":["ZHANG Zhouqiang","Zhouqiang Zhang"],"block_key":"z zhang","works_api_url":"https://api.openalex.org/works?filter=author.id:A5081798280","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5081798280","updated_date":"2026-11-13T15:08:24","created_date":"2016-06-24T00:00:00"}