{"id":"https://openalex.org/A5081497113","orcid":"https://orcid.org/0009-0009-4350-5619","observed_orcids":["https://orcid.org/0009-0009-4350-5619"],"display_name":"L. Nebrich","raw_author_names":["L Nebrich","L. Nebrich","Lars Nebrich","Nebrich, L.","Nebrich, Lars"],"full_name":"Nebrich, Lars","works_count":29,"cited_by_count":110,"summary_stats":{"2yr_mean_citedness":2.1666666666666665,"h_index":4,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5081497113","orcid":"https://orcid.org/0009-0009-4350-5619","observed_orcids":["https://orcid.org/0009-0009-4350-5619"]},"affiliations":[{"institution":{"id":"https://openalex.org/I32021983","ror":"https://ror.org/04v76ef78","display_name":"Christian-Albrechts-Universit\u00e4t zu Kiel","country_code":"DE","type":"education","lineage":["https://openalex.org/I32021983"]},"years":[2001,2000]},{"institution":{"id":"https://openalex.org/I4210128143","ror":"https://ror.org/02hm5m482","display_name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210128143","https://openalex.org/I4923324"]},"years":[2026,2025,2010]},{"institution":{"id":"https://openalex.org/I4210134425","ror":"https://ror.org/031aqk326","display_name":"Fraunhofer Institute for Reliability and Microintegration","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210134425","https://openalex.org/I4923324"]},"years":[2009,2008,2005,2004]},{"institution":{"id":"https://openalex.org/I4923324","ror":"https://ror.org/05hkkdn48","display_name":"Fraunhofer-Gesellschaft","country_code":"DE","type":"government","lineage":["https://openalex.org/I4923324"]},"years":[2009,2008,2005,2004]}],"last_known_institutions":[{"id":"https://openalex.org/I4210128143","ror":"https://ror.org/02hm5m482","display_name":"Fraunhofer Research Institution for Microsystems and Solid State Technologies","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210128143","https://openalex.org/I4923324"]}],"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10020","display_name":"Quantum Information and Cryptography","count":6,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":0.000106,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":5.21e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","value":5.12e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":4.24e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":3.27e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8679007291793823},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7987438440322876},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5090000033378601},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.4444639980792999},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.36149999499320984}],"counts_by_year":[{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":6,"oa_works_count":0,"cited_by_count":19},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2018,"works_count":2,"oa_works_count":2,"cited_by_count":4},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2021,"works_count":2,"oa_works_count":2,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":4,"oa_works_count":4,"cited_by_count":6},{"year":2026,"works_count":2,"oa_works_count":2,"cited_by_count":8}],"display_name_alternatives":["L Nebrich","L. Nebrich","Lars Nebrich","Nebrich, L.","Nebrich, Lars"],"block_key":"l nebrich","works_api_url":"https://api.openalex.org/works?filter=author.id:A5081497113","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5081497113","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}