{"id":"https://openalex.org/A5081136840","orcid":null,"observed_orcids":[],"display_name":"Mirko Riedel","raw_author_names":["M. Riedel","Mirko RIEDEL","Mirko Riedel","Mirko Riedel (11635777)","Riedel, Mirko","Riedel, Mirko 1977-","Riedel, Mirko Philipp"],"full_name":"Mirko Riedel","works_count":53,"cited_by_count":155,"summary_stats":{"2yr_mean_citedness":2.8,"h_index":7,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5081136840","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210124503","ror":"https://ror.org/026taa863","display_name":"Fraunhofer Institute for Machine Tools and Forming Technology","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210124503","https://openalex.org/I4923324"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I4210139239","ror":"https://ror.org/03qjp1d79","display_name":"Helmholtz-Zentrum Hereon","country_code":"DE","type":"government","lineage":["https://openalex.org/I1305996414","https://openalex.org/I4210139239"]},"years":[2025,2024,2023,2022,2021,2020]},{"institution":{"id":"https://openalex.org/I4405277591","ror":"https://ror.org/038es9179","display_name":"Fraunhofer Institute for Machine Tools and Forming Technology Dresden","country_code":"DE","type":"facility","lineage":["https://openalex.org/I4210124503","https://openalex.org/I4405277591","https://openalex.org/I4923324"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I62916508","ror":"https://ror.org/02kkvpp62","display_name":"Technical University of Munich","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]},"years":[2026,2025,2024,2023,2022,2021,2020]},{"institution":{"id":"https://openalex.org/I78650965","ror":"https://ror.org/042aqky30","display_name":"Technische Universit\u00e4t Dresden","country_code":"DE","type":"education","lineage":["https://openalex.org/I78650965"]},"years":[2016,2014]}],"last_known_institutions":[{"id":"https://openalex.org/I62916508","ror":"https://ror.org/02kkvpp62","display_name":"Technical University of Munich","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"topics":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","count":22,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":20,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","count":16,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":13,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","count":9,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","value":0.0001593,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","value":0.0001547,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","value":0.0001207,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":0.0001062,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13258","display_name":"Williams Syndrome Research","value":8.55e-05,"subfield":{"id":"https://openalex.org/subfields/2806","display_name":"Developmental Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8297871947288513},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7077000141143799},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6289889216423035},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5408999919891357},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.4973137676715851}],"counts_by_year":[{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2013,"works_count":2,"oa_works_count":0,"cited_by_count":6},{"year":2014,"works_count":2,"oa_works_count":1,"cited_by_count":4},{"year":2016,"works_count":4,"oa_works_count":2,"cited_by_count":20},{"year":2017,"works_count":5,"oa_works_count":1,"cited_by_count":1},{"year":2018,"works_count":5,"oa_works_count":2,"cited_by_count":0},{"year":2019,"works_count":2,"oa_works_count":2,"cited_by_count":1},{"year":2020,"works_count":4,"oa_works_count":2,"cited_by_count":25},{"year":2021,"works_count":5,"oa_works_count":4,"cited_by_count":39},{"year":2022,"works_count":6,"oa_works_count":5,"cited_by_count":10},{"year":2023,"works_count":5,"oa_works_count":5,"cited_by_count":13},{"year":2024,"works_count":6,"oa_works_count":3,"cited_by_count":15},{"year":2025,"works_count":3,"oa_works_count":3,"cited_by_count":11},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":2}],"display_name_alternatives":["M. Riedel","Mirko RIEDEL","Mirko Riedel","Mirko Riedel (11635777)","Riedel, Mirko","Riedel, Mirko 1977-","Riedel, Mirko Philipp"],"block_key":"m riedel","works_api_url":"https://api.openalex.org/works?filter=author.id:A5081136840","updated_date":"2026-10-16T12:29:29","created_date":"2022-07-25T00:00:00"}