{"id":"https://openalex.org/A5080976111","orcid":null,"observed_orcids":[],"display_name":"Eiji Inuzuka","raw_author_names":["E Inuzuka","E. Inuzuka","Eiji Inuzuka"],"full_name":"Eiji Inuzuka","works_count":29,"cited_by_count":138,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5080976111","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I150993360","ror":"https://ror.org/03natb733","display_name":"Hamamatsu Photonics (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I150993360"]},"years":[2002,1991,1990,1988,1986,1985,1984]},{"institution":{"id":"https://openalex.org/I189513530","ror":"https://ror.org/056bksm23","display_name":"Osaka Electro-Communication University","country_code":"JP","type":"education","lineage":["https://openalex.org/I189513530"]},"years":[1988]}],"last_known_institutions":[{"id":"https://openalex.org/I150993360","ror":"https://ror.org/03natb733","display_name":"Hamamatsu Photonics (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I150993360"]}],"topics":[{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","count":11,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","count":10,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10566","display_name":"Laser-Matter Interactions and Applications","count":8,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","value":0.0001766,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","value":8e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","value":4.84e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":4.24e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14163","display_name":"Astronomical Observations and Instrumentation","value":3.5e-05,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"12880257","wikidata":"https://www.wikidata.org/wiki/Q901091","display_name":"Streak camera","score":0.9870270490646362},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7680510878562927},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7510653734207153},{"id":"520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","score":0.7130734920501709},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6478403806686401}],"counts_by_year":[{"year":1975,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1979,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1980,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1981,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1982,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1983,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1984,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1985,"works_count":9,"oa_works_count":0,"cited_by_count":0},{"year":1986,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1988,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1990,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["E Inuzuka","E. Inuzuka","Eiji Inuzuka"],"block_key":"e inuzuka","works_api_url":"https://api.openalex.org/works?filter=author.id:A5080976111","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5080976111","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}